Multi-Label Feature Selection With Missing Features via Implicit Label Replenishment and Positive Correlation Feature Recovery

IF 8.9 2区 计算机科学 Q1 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE
Jianhua Dai;Wenxiang Chen;Yuhua Qian
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引用次数: 0

Abstract

Multi-label feature selection can effectively solve the curse of dimensionality problem in multi-label learning. Existing multi-label feature selection methods mostly handle multi-label data without missing features. However, in practical applications, multi-label data with missing features exist widely, and most existing multi-label feature selection methods are not directly applicable. Therefore, we propose a feature selection method for multi-label data with missing features. First, we propose a method to extract implicit label information from the feature space to replenish the binary label information. Second, we learn the positive correlation between features to construct a feature correlation recovery matrix to recover missing features. Finally, we design a sparse model-based multi-label feature selection method for processing multi-label data with missing features and prove the convergence of this method. Comparative experiments with existing feature selection methods demonstrate the effectiveness of our method.
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来源期刊
IEEE Transactions on Knowledge and Data Engineering
IEEE Transactions on Knowledge and Data Engineering 工程技术-工程:电子与电气
CiteScore
11.70
自引率
3.40%
发文量
515
审稿时长
6 months
期刊介绍: The IEEE Transactions on Knowledge and Data Engineering encompasses knowledge and data engineering aspects within computer science, artificial intelligence, electrical engineering, computer engineering, and related fields. It provides an interdisciplinary platform for disseminating new developments in knowledge and data engineering and explores the practicality of these concepts in both hardware and software. Specific areas covered include knowledge-based and expert systems, AI techniques for knowledge and data management, tools, and methodologies, distributed processing, real-time systems, architectures, data management practices, database design, query languages, security, fault tolerance, statistical databases, algorithms, performance evaluation, and applications.
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