{"title":"Machine Unlearning Through Fine-Grained Model Parameters Perturbation","authors":"Zhiwei Zuo;Zhuo Tang;Kenli Li;Anwitaman Datta","doi":"10.1109/TKDE.2025.3528551","DOIUrl":null,"url":null,"abstract":"Machine unlearning involves retracting data records and reducing their influence on trained models, aiding user privacy protection, at a significant computational cost potentially. Weight perturbation-based unlearning is common but typically modifies parameters globally. We propose fine-grained Top-K and Random-k parameters perturbed inexact machine unlearning that address the privacy needs while keeping the computational costs tractable. However, commonly used training data are independent and identically distributed, for inexact machine unlearning, current metrics are inadequate in quantifying unlearning degree that occurs after unlearning. To address this quantification issue, we introduce SPD-GAN, which subtly perturbs data distribution targeted for unlearning. Then, we evaluate unlearning degree by measuring the performance difference of the models on the perturbed unlearning data before and after unlearning. Furthermore, to demonstrate efficacy, we tackle the challenge of evaluating machine unlearning by assessing model generalization across unlearning and remaining data. To better assess the unlearning effect and model generalization, we propose novel metrics, namely, the forgetting rate and memory retention rate. By implementing these innovative techniques and metrics, we achieve computationally efficacious privacy protection in machine learning applications without significant sacrifice of model performance. A by-product of our work is a novel method for evaluating and quantifying unlearning degree.","PeriodicalId":13496,"journal":{"name":"IEEE Transactions on Knowledge and Data Engineering","volume":"37 4","pages":"1975-1988"},"PeriodicalIF":8.9000,"publicationDate":"2025-01-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Knowledge and Data Engineering","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10839062/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
引用次数: 0
Abstract
Machine unlearning involves retracting data records and reducing their influence on trained models, aiding user privacy protection, at a significant computational cost potentially. Weight perturbation-based unlearning is common but typically modifies parameters globally. We propose fine-grained Top-K and Random-k parameters perturbed inexact machine unlearning that address the privacy needs while keeping the computational costs tractable. However, commonly used training data are independent and identically distributed, for inexact machine unlearning, current metrics are inadequate in quantifying unlearning degree that occurs after unlearning. To address this quantification issue, we introduce SPD-GAN, which subtly perturbs data distribution targeted for unlearning. Then, we evaluate unlearning degree by measuring the performance difference of the models on the perturbed unlearning data before and after unlearning. Furthermore, to demonstrate efficacy, we tackle the challenge of evaluating machine unlearning by assessing model generalization across unlearning and remaining data. To better assess the unlearning effect and model generalization, we propose novel metrics, namely, the forgetting rate and memory retention rate. By implementing these innovative techniques and metrics, we achieve computationally efficacious privacy protection in machine learning applications without significant sacrifice of model performance. A by-product of our work is a novel method for evaluating and quantifying unlearning degree.
期刊介绍:
The IEEE Transactions on Knowledge and Data Engineering encompasses knowledge and data engineering aspects within computer science, artificial intelligence, electrical engineering, computer engineering, and related fields. It provides an interdisciplinary platform for disseminating new developments in knowledge and data engineering and explores the practicality of these concepts in both hardware and software. Specific areas covered include knowledge-based and expert systems, AI techniques for knowledge and data management, tools, and methodologies, distributed processing, real-time systems, architectures, data management practices, database design, query languages, security, fault tolerance, statistical databases, algorithms, performance evaluation, and applications.