Chenxi Gu;Xinli Wang;Kang Li;Xiaohong Yin;Shaoyuan Li;Lei Wang
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引用次数: 0
Abstract
This paper proposes an event-triggered stochastic model predictive control for discrete-time linear time-invariant (LTI) systems under additive stochastic disturbances. It first constructs a probabilistic invariant set and a probabilistic reachable set based on the priori knowledge of system uncertainties. Assisted with enhanced robust tubes, the chance constraints are then formulated into a deterministic form. To alleviate the online computational burden, a novel event-triggered stochastic model predictive control is developed, where the triggering condition is designed based on the past and future optimal trajectory tracking errors in order to achieve a good trade-off between system resource utilization and control performance. Two triggering parameters σ and γ are used to adjust the frequency of solving the optimization problem. The probabilistic feasibility and stability of the system under the event-triggered mechanism are also examined. Finally, numerical studies on the control of a heating, ventilation, and air conditioning (HVAC) system confirm the efficacy of the proposed control.
期刊介绍:
The IEEE/CAA Journal of Automatica Sinica is a reputable journal that publishes high-quality papers in English on original theoretical/experimental research and development in the field of automation. The journal covers a wide range of topics including automatic control, artificial intelligence and intelligent control, systems theory and engineering, pattern recognition and intelligent systems, automation engineering and applications, information processing and information systems, network-based automation, robotics, sensing and measurement, and navigation, guidance, and control.
Additionally, the journal is abstracted/indexed in several prominent databases including SCIE (Science Citation Index Expanded), EI (Engineering Index), Inspec, Scopus, SCImago, DBLP, CNKI (China National Knowledge Infrastructure), CSCD (Chinese Science Citation Database), and IEEE Xplore.