Doaa Almhaithawi, Alessandro Bellini, Georgios C Chasparis, Tania Cerquitelli
{"title":"Investigating the Potential of Latent Space for the Classification of Paint Defects.","authors":"Doaa Almhaithawi, Alessandro Bellini, Georgios C Chasparis, Tania Cerquitelli","doi":"10.3390/jimaging11020033","DOIUrl":null,"url":null,"abstract":"<p><p>Defect detection methods have greatly assisted human operators in various fields, from textiles to surfaces and mechanical components, by facilitating decision-making processes and reducing visual fatigue. This area of research is widely recognized as a cross-industry concern, particularly in the manufacturing sector. Nevertheless, each specific application brings unique challenges that require tailored solutions. This paper presents a novel framework for leveraging latent space representations in defect detection tasks, focusing on improving explainability while maintaining accuracy. This work delves into how latent spaces can be utilized by integrating unsupervised and supervised analyses. We propose a hybrid methodology that not only identifies known defects but also provides a mechanism for detecting anomalies and dynamically adapting to new defect types. This dual approach supports human operators, reducing manual workload and enhancing interpretability.</p>","PeriodicalId":37035,"journal":{"name":"Journal of Imaging","volume":"11 2","pages":""},"PeriodicalIF":2.7000,"publicationDate":"2025-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11856999/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/jimaging11020033","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY","Score":null,"Total":0}
引用次数: 0
Abstract
Defect detection methods have greatly assisted human operators in various fields, from textiles to surfaces and mechanical components, by facilitating decision-making processes and reducing visual fatigue. This area of research is widely recognized as a cross-industry concern, particularly in the manufacturing sector. Nevertheless, each specific application brings unique challenges that require tailored solutions. This paper presents a novel framework for leveraging latent space representations in defect detection tasks, focusing on improving explainability while maintaining accuracy. This work delves into how latent spaces can be utilized by integrating unsupervised and supervised analyses. We propose a hybrid methodology that not only identifies known defects but also provides a mechanism for detecting anomalies and dynamically adapting to new defect types. This dual approach supports human operators, reducing manual workload and enhancing interpretability.