Simulation of electric field distribution of gas insulated switchgear considering metal tip defect locations and structural parameters

IF 1.4 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Wenhao Gao, Zhaoyang Kang, Kai Nie, Ze Li, Fuqiang Ren, Hongru Zhang, Fanbo Meng, Qingquan Li, Simeng Li
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Abstract

Metal tip defect is a typical insulation defect in gas insulated switchgear (GIS). Simulation research on the defect under multi-physical field coupling was conducted in order to explore the realistic electric field distribution. The results of the simulation were confirmed by a partial discharge experiment. On the one hand, the influence of defect location and structural parameters on electric field distribution was investigated in the established defect model. On the other hand, the partial discharge experimental platform was built to obtain the initial voltage of partial discharge under this defect. The results show that the presence of the defects can increase the electric field distortion by several-fold or more in the surrounding electric field. The closer the defect on the outside of the conductor is to the basin-type insulator, the lower the electric field distortion is around the conductor. However, the opposite is true on the inside of the shell. The change in the top radius of the defect has the greatest impact on the electric field distribution. The experimental results verify the validity of the simulation model. This study augments the research on insulation defects in GIS, offering a valuable reference for the manufacturing and installation of GIS.

Abstract Image

考虑金属尖端缺陷位置和结构参数的气体绝缘开关柜电场分布仿真
金属端部缺陷是气体绝缘开关设备中典型的绝缘缺陷。为了探索真实的电场分布,对多物理场耦合下的缺陷进行了仿真研究。通过局部放电实验验证了模拟结果。一方面,在建立的缺陷模型中,研究了缺陷位置和结构参数对电场分布的影响。另一方面,建立了局部放电实验平台,得到了该缺陷下局部放电的初始电压。结果表明,缺陷的存在会使周围电场的电场畸变增大数倍甚至更多。导体外部的缺陷越靠近盆型绝缘子,导体周围的电场畸变越小。然而,在壳的内部,情况正好相反。缺陷顶半径的变化对电场分布的影响最大。实验结果验证了仿真模型的有效性。本研究补充了对GIS中绝缘缺陷的研究,为GIS的制造和安装提供了有价值的参考。
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来源期刊
Iet Science Measurement & Technology
Iet Science Measurement & Technology 工程技术-工程:电子与电气
CiteScore
4.30
自引率
7.10%
发文量
41
审稿时长
7.5 months
期刊介绍: IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.
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