SBDNet: A deep learning-based method for the segmentation and quantification of fatigue cracks in steel bridges

IF 8 1区 工程技术 Q1 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE
Xiao Wang , Qingrui Yue , Xiaogang Liu
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引用次数: 0

Abstract

Employing deep learning to automate the processing of fatigue crack images in steel structure bridges is a cutting-edge research frontier in damage assessment and safe operation. However, existing methods lack pixel-level segmentation accuracy and quantitative metrics for model generalization. This paper introduces Steel Bridge Damage Networks (SBDNet), which is designed for high-precision pixel-level segmentation and quantification of fatigue cracks. We established metrics to measure domain differences between training and test sets and validated SBDNet on a fatigue crack image dataset, comparing its performance with state-of-the-art models. Results show that SBDNet achieves an average IoU of 76.8% and a crack geometric quantification error of less than 3%, exhibiting robust generalization. The proposed method enhances damage detection efficiency and provides quantitative references for maintenance decision-making.
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来源期刊
Advanced Engineering Informatics
Advanced Engineering Informatics 工程技术-工程:综合
CiteScore
12.40
自引率
18.20%
发文量
292
审稿时长
45 days
期刊介绍: Advanced Engineering Informatics is an international Journal that solicits research papers with an emphasis on 'knowledge' and 'engineering applications'. The Journal seeks original papers that report progress in applying methods of engineering informatics. These papers should have engineering relevance and help provide a scientific base for more reliable, spontaneous, and creative engineering decision-making. Additionally, papers should demonstrate the science of supporting knowledge-intensive engineering tasks and validate the generality, power, and scalability of new methods through rigorous evaluation, preferably both qualitatively and quantitatively. Abstracting and indexing for Advanced Engineering Informatics include Science Citation Index Expanded, Scopus and INSPEC.
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