A teacher-student framework leveraging large vision model for data pre-annotation and YOLO for tunnel lining multiple defects instance segmentation

IF 10.4 1区 计算机科学 Q1 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS
Hanlong Yang , Lujie Wang , Yue Pan , Jin-Jian Chen
{"title":"A teacher-student framework leveraging large vision model for data pre-annotation and YOLO for tunnel lining multiple defects instance segmentation","authors":"Hanlong Yang ,&nbsp;Lujie Wang ,&nbsp;Yue Pan ,&nbsp;Jin-Jian Chen","doi":"10.1016/j.jii.2025.100790","DOIUrl":null,"url":null,"abstract":"<div><div>To achieve an accurate and efficient instance segmentation task for multiple defects within tunnel linings, this paper proposes a simple yet powerful Teacher-Student Framework (TeSF) leveraging the emerging Large Vision Model (LVM) and the advanced You Only Look Once v5 (YOLO v5) model. TeSF integrates a pre-trained LVM within the Teacher Module to alleviate data annotation efforts. Concurrently, the Student Module introduces a novel top-down model architecture, amalgamating YOLO v5 for top-level Classification &amp; Localization and a Segment Head for down-level Segmentation, resulting in YOLO-SH. The Teacher Module acts as a data engine for automatic learning in the Student Module through a well-designed loss function. The proposed TeSF is tested in images collected from Shanghai metro tunnels to automatically recognize five different types of tunnel surface defects. Experiment results indicate that: (1) The LVM-based data annotation procedure in the Teacher Module surpasses the efficacy of the traditional manual method. (2) Optimal equilibrium between computational efficiency and segmentation accuracy is achieved with a medium-sized backbone for YOLO v5, yielding mask [email protected] values of 0.644 and 0.694, all within an inference time of 6.2ms/image. (3) The top-down Student Module with YOLO-SH v5m exhibits superior performance in instance segmentation compared to state-of-the-art models, bringing improvements of no less than 8.2% and 6.3% in box [email protected] and mask [email protected], respectively. In short, the novelty of TeSF lies in the utilization of the pre-trained LVM for streamlined data annotation coupled with the augmentation of YOLO-SH for a more cost-effective and precise detection of multiple defects within tunnels. The applicability of TeSF can extend to the analysis of 3D scanner images derived from in-service tunnel environments.</div></div>","PeriodicalId":55975,"journal":{"name":"Journal of Industrial Information Integration","volume":"44 ","pages":"Article 100790"},"PeriodicalIF":10.4000,"publicationDate":"2025-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Industrial Information Integration","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2452414X25000147","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS","Score":null,"Total":0}
引用次数: 0

Abstract

To achieve an accurate and efficient instance segmentation task for multiple defects within tunnel linings, this paper proposes a simple yet powerful Teacher-Student Framework (TeSF) leveraging the emerging Large Vision Model (LVM) and the advanced You Only Look Once v5 (YOLO v5) model. TeSF integrates a pre-trained LVM within the Teacher Module to alleviate data annotation efforts. Concurrently, the Student Module introduces a novel top-down model architecture, amalgamating YOLO v5 for top-level Classification & Localization and a Segment Head for down-level Segmentation, resulting in YOLO-SH. The Teacher Module acts as a data engine for automatic learning in the Student Module through a well-designed loss function. The proposed TeSF is tested in images collected from Shanghai metro tunnels to automatically recognize five different types of tunnel surface defects. Experiment results indicate that: (1) The LVM-based data annotation procedure in the Teacher Module surpasses the efficacy of the traditional manual method. (2) Optimal equilibrium between computational efficiency and segmentation accuracy is achieved with a medium-sized backbone for YOLO v5, yielding mask [email protected] values of 0.644 and 0.694, all within an inference time of 6.2ms/image. (3) The top-down Student Module with YOLO-SH v5m exhibits superior performance in instance segmentation compared to state-of-the-art models, bringing improvements of no less than 8.2% and 6.3% in box [email protected] and mask [email protected], respectively. In short, the novelty of TeSF lies in the utilization of the pre-trained LVM for streamlined data annotation coupled with the augmentation of YOLO-SH for a more cost-effective and precise detection of multiple defects within tunnels. The applicability of TeSF can extend to the analysis of 3D scanner images derived from in-service tunnel environments.
求助全文
约1分钟内获得全文 求助全文
来源期刊
Journal of Industrial Information Integration
Journal of Industrial Information Integration Decision Sciences-Information Systems and Management
CiteScore
22.30
自引率
13.40%
发文量
100
期刊介绍: The Journal of Industrial Information Integration focuses on the industry's transition towards industrial integration and informatization, covering not only hardware and software but also information integration. It serves as a platform for promoting advances in industrial information integration, addressing challenges, issues, and solutions in an interdisciplinary forum for researchers, practitioners, and policy makers. The Journal of Industrial Information Integration welcomes papers on foundational, technical, and practical aspects of industrial information integration, emphasizing the complex and cross-disciplinary topics that arise in industrial integration. Techniques from mathematical science, computer science, computer engineering, electrical and electronic engineering, manufacturing engineering, and engineering management are crucial in this context.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信