Joonho Seon;Seongwoo Lee;Young Ghyu Sun;Soo Hyun Kim;Dong In Kim;Jin Young Kim
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引用次数: 0
Abstract
In industrial Internet of Things (IIoT) systems, imbalanced datasets are prevalent because of the relative ease of acquiring normal operational data compared to abnormal or faulty data. An unbalanced distribution of data may lead to a biased learning problem, resulting in performance degradation of deep learning models. Data augmentation approaches based on generative adversarial networks (GAN) have been proposed to mitigate biased learning problems. However, GAN-based approaches constructed solely with convolutional neural networks may be incapable of extracting temporal properties from data. To utilize the temporal properties of data, a novel GAN structure consisting of an embedding network and recurrent neural networks is proposed in this paper. Additionally, in the novel GAN model based on mean-squared error, modified loss and mutual information terms are employed to improve training stability. From simulation results, it is confirmed that classification accuracy can be significantly improved by up to 54% based on the proposed method when compared with conventional fault diagnosis methods.
期刊介绍:
The IEEE Transactions on Emerging Topics in Computational Intelligence (TETCI) publishes original articles on emerging aspects of computational intelligence, including theory, applications, and surveys.
TETCI is an electronics only publication. TETCI publishes six issues per year.
Authors are encouraged to submit manuscripts in any emerging topic in computational intelligence, especially nature-inspired computing topics not covered by other IEEE Computational Intelligence Society journals. A few such illustrative examples are glial cell networks, computational neuroscience, Brain Computer Interface, ambient intelligence, non-fuzzy computing with words, artificial life, cultural learning, artificial endocrine networks, social reasoning, artificial hormone networks, computational intelligence for the IoT and Smart-X technologies.