{"title":"An Efficient Frequency Domain Based Attribution and Detection Network","authors":"Junbin Zhang;Yixiao Wang;Hamid Reza Tohidypour;Panos Nasiopoulos","doi":"10.1109/ACCESS.2025.3534829","DOIUrl":null,"url":null,"abstract":"People nowadays can easily synthesize high fidelity fake images with different types of image content due to the rapid advances of deep learning technologies. Detecting such images and attributing them to their generative models (GMs) is crucial. Existing deep learning methods attempt to identify and classify GM-specific artifacts but often struggle with content-independence and generalizability. In this paper, we observe that while GMs leave unique artifacts in the frequency domain, they are coupled with the image content. Based on this observation, we propose a novel deep learning-based solution that learns input-adaptive masks to highlight GMs’ artifacts and achieve high accuracy on the synthesized image attribution task. In addition, we observed that GMs’ artifacts in the frequency domain remain intact in sub-images of the original image, and they are even retained when the images are distorted. To further improve the accuracy of the proposed solution, we leverage the characteristics of GMs artifacts in sub-images and distorted images to make our network perform more effectively. Our evaluation results show that our proposed solution outperforms other state-of-the-art methods on unseen image types, showing great generalizability.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"19909-19921"},"PeriodicalIF":3.4000,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10855423","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10855423/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
People nowadays can easily synthesize high fidelity fake images with different types of image content due to the rapid advances of deep learning technologies. Detecting such images and attributing them to their generative models (GMs) is crucial. Existing deep learning methods attempt to identify and classify GM-specific artifacts but often struggle with content-independence and generalizability. In this paper, we observe that while GMs leave unique artifacts in the frequency domain, they are coupled with the image content. Based on this observation, we propose a novel deep learning-based solution that learns input-adaptive masks to highlight GMs’ artifacts and achieve high accuracy on the synthesized image attribution task. In addition, we observed that GMs’ artifacts in the frequency domain remain intact in sub-images of the original image, and they are even retained when the images are distorted. To further improve the accuracy of the proposed solution, we leverage the characteristics of GMs artifacts in sub-images and distorted images to make our network perform more effectively. Our evaluation results show that our proposed solution outperforms other state-of-the-art methods on unseen image types, showing great generalizability.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.