A fault-tolerant topology for single-phase H-bridge inverters addressing open- and short-circuit failures for industrial applications

Chouaib Djaghloul , Noman Khan , Khalil El Khamlichi Drissi , Kambiz Tehrani
{"title":"A fault-tolerant topology for single-phase H-bridge inverters addressing open- and short-circuit failures for industrial applications","authors":"Chouaib Djaghloul ,&nbsp;Noman Khan ,&nbsp;Khalil El Khamlichi Drissi ,&nbsp;Kambiz Tehrani","doi":"10.1016/j.fraope.2024.100189","DOIUrl":null,"url":null,"abstract":"<div><div>This paper proposes a fault-tolerant topology for single-phase inverters, designed to sustain functionality following open- or short-circuit failures in one of its semiconductor switches. A simple approach is employed for the fault detection mechanism, using the load current, the switch current, and the switch gate voltage. Once a fault is detected and isolated, a redundant leg comprising two semi-conductors is connected to replace the faulty one after it has been eliminated using isolation relays. The effectiveness of this approach is validated through simulation using MATLAB Simulink, demonstrating both the speed and efficacy of the fault-tolerant topology in restoring normal operation post-fault occurrence.</div></div>","PeriodicalId":100554,"journal":{"name":"Franklin Open","volume":"10 ","pages":"Article 100189"},"PeriodicalIF":0.0000,"publicationDate":"2024-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Franklin Open","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2773186324001191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper proposes a fault-tolerant topology for single-phase inverters, designed to sustain functionality following open- or short-circuit failures in one of its semiconductor switches. A simple approach is employed for the fault detection mechanism, using the load current, the switch current, and the switch gate voltage. Once a fault is detected and isolated, a redundant leg comprising two semi-conductors is connected to replace the faulty one after it has been eliminated using isolation relays. The effectiveness of this approach is validated through simulation using MATLAB Simulink, demonstrating both the speed and efficacy of the fault-tolerant topology in restoring normal operation post-fault occurrence.
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信