Rongrong Jiang, Yirong Yao, Jianmin Guan, Jiafeng Shen, Huanming Lu, Ming Li
{"title":"Application of SEM-CL system in the characterization of material microstructures","authors":"Rongrong Jiang, Yirong Yao, Jianmin Guan, Jiafeng Shen, Huanming Lu, Ming Li","doi":"10.1007/s11706-024-0709-5","DOIUrl":null,"url":null,"abstract":"<div><p>Cathodoluminescence (CL) characterization technology refers to a technical approach for evaluating the luminescent properties of samples by collecting photon signals generated under electron beam excitation. By detecting the intensity and wavelength of the emitted light, the energy band structure and forbidden bandwidth of a sample can be identified. After a CL spectrometer is mounted on a scanning electron microscope (SEM), functions are integrated, such as high spatial resolution, morphological observation, and energy-dispersive spectroscopy (EDS) to analyze samples, offering unique and irreplaceable advantages for the microstructural analysis of certain materials. This paper reviews the applications of SEM-CL systems in the characterization of material microstructures in recent years, illustrating the utility of the SEM-CL system in various materials including geological minerals, perovskite materials, semiconductor materials, non-metallic inclusions, and functional ceramics through typical case studies.</p></div>","PeriodicalId":572,"journal":{"name":"Frontiers of Materials Science","volume":"18 4","pages":""},"PeriodicalIF":2.5000,"publicationDate":"2024-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Frontiers of Materials Science","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s11706-024-0709-5","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Cathodoluminescence (CL) characterization technology refers to a technical approach for evaluating the luminescent properties of samples by collecting photon signals generated under electron beam excitation. By detecting the intensity and wavelength of the emitted light, the energy band structure and forbidden bandwidth of a sample can be identified. After a CL spectrometer is mounted on a scanning electron microscope (SEM), functions are integrated, such as high spatial resolution, morphological observation, and energy-dispersive spectroscopy (EDS) to analyze samples, offering unique and irreplaceable advantages for the microstructural analysis of certain materials. This paper reviews the applications of SEM-CL systems in the characterization of material microstructures in recent years, illustrating the utility of the SEM-CL system in various materials including geological minerals, perovskite materials, semiconductor materials, non-metallic inclusions, and functional ceramics through typical case studies.
期刊介绍：
Frontiers of Materials Science is a peer-reviewed international journal that publishes high quality reviews/mini-reviews, full-length research papers, and short Communications recording the latest pioneering studies on all aspects of materials science. It aims at providing a forum to promote communication and exchange between scientists in the worldwide materials science community.
The subjects are seen from international and interdisciplinary perspectives covering areas including (but not limited to):
Biomaterials including biomimetics and biomineralization;
Nano materials;
Polymers and composites;
New metallic materials;
Advanced ceramics;
Materials modeling and computation;
Frontier materials synthesis and characterization;
Novel methods for materials manufacturing;
Materials performance;
Materials applications in energy, information and biotechnology.
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