Comparative analysis of thermally evaporated nanoscale CdS thin film's structural, morphological, optical and nanomechanical properties

IF 4 2区 化学 Q2 CHEMISTRY, PHYSICAL
Shailendra Kumar Gaur , Ashwani Chaudhary , Qasim Murtaza , R.S. Mishra
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引用次数: 0

Abstract

CdS nanoscale thin films were deposited on glass substrates at 1, 5 and 10 Å/s deposition rates by thermal evaporation process. The structural, morphological, compositional, optical and nanomechanical properties of CdS thin films were analyzed by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), energy dispersive x-ray (EDX), UV-vis spectrophotometer and nanoindentation. XRD diffractogram indicate that the deposited CdS thin films have hexagonal structure with preferred orientation towards (002) plane and nearly stoichiometric composition. Various crystal structure parameters like lattice constant, crystallite size, defect density, dislocation density, lattice strain, number of crystallite per unit surface, stacking fault were determined. From XRD results, the calculated crystal structure parameters such as the crystallite size, microstrain and defect density were in the range of 20.4-14.7 nm, 7.74-10.62 and 2.3-4.52 × 1011 lines/cm2, at 1, 5 and 10 Å/s deposition rates, respectively .The AFM images indicated that the film's rms surface roughnesses were 2.73 nm, 2.94 nm and 3.18 nm at 1, 5 and 10 Å/s, respectively. The SEM images indicated that the films were uniform, continuous and defect free. The EDX examination revealed that at 1 Å/s deposition rate the film was nearly stoichiometic. The optical band gaps were determined to be in the range of 2.37-2.43 eV. Nanoindentation tests evaluated the hardness, Young's modulus, creep behavior and strain rate of CdS films. Hardness evaluated to be 0.14-1.48 GPa, 0.15-2.46 GPa, and 0.21-2.55 GPa at 1,5 and 10 Å/s deposition rate, respectively for 20-50 µN load. The Young's modulus decreases 1-5 Å/s deposition rate and becomes almost constant 5-10 Å/s deposition rate at 70 µN load. The characterization of CdS thin film recommend it as a favorable window layer in applications like photovoltaic, optoelectronic, thermoelectric and solar cells.
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来源期刊
Journal of Molecular Structure
Journal of Molecular Structure 化学-物理化学
CiteScore
7.10
自引率
15.80%
发文量
2384
审稿时长
45 days
期刊介绍: The Journal of Molecular Structure is dedicated to the publication of full-length articles and review papers, providing important new structural information on all types of chemical species including: • Stable and unstable molecules in all types of environments (vapour, molecular beam, liquid, solution, liquid crystal, solid state, matrix-isolated, surface-absorbed etc.) • Chemical intermediates • Molecules in excited states • Biological molecules • Polymers. The methods used may include any combination of spectroscopic and non-spectroscopic techniques, for example: • Infrared spectroscopy (mid, far, near) • Raman spectroscopy and non-linear Raman methods (CARS, etc.) • Electronic absorption spectroscopy • Optical rotatory dispersion and circular dichroism • Fluorescence and phosphorescence techniques • Electron spectroscopies (PES, XPS), EXAFS, etc. • Microwave spectroscopy • Electron diffraction • NMR and ESR spectroscopies • Mössbauer spectroscopy • X-ray crystallography • Charge Density Analyses • Computational Studies (supplementing experimental methods) We encourage publications combining theoretical and experimental approaches. The structural insights gained by the studies should be correlated with the properties, activity and/ or reactivity of the molecule under investigation and the relevance of this molecule and its implications should be discussed.
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