Fundamental understanding of voltage decay in Li-rich Mn-based layered oxides cathode materials

Huixian Xie, Jiacheng Xiao, Hongyi Chen, Boyang Zhang, Kwun Nam Hui, Shanqing Zhang, Chenyu Liu, Dong Luo, Zhan Lin
{"title":"Fundamental understanding of voltage decay in Li-rich Mn-based layered oxides cathode materials","authors":"Huixian Xie,&nbsp;Jiacheng Xiao,&nbsp;Hongyi Chen,&nbsp;Boyang Zhang,&nbsp;Kwun Nam Hui,&nbsp;Shanqing Zhang,&nbsp;Chenyu Liu,&nbsp;Dong Luo,&nbsp;Zhan Lin","doi":"10.1007/s43673-024-00138-2","DOIUrl":null,"url":null,"abstract":"<div><p>To satisfy the needs of modern intelligent society for power supplies with long-endurance ability, Li-rich Mn-based layered oxides (LRMOs) are receiving much attention because of their ultrahigh capacity. However, their real-world implementation is hindered by the serious voltage decay, which results in a continuous decrease in energy density. The understanding on voltage decay still remains a mystery due to the complicated hybrid cationic-anionic redox and the serious surface-interface reactions in LRMOs. Moreover, some of the mechanisms are occasionally contradictory, indicating that the origin of voltage decay is still unclear. As a result, none of the innovative strategies proposed on the basis of mechanisms has effectively alleviated the problem of voltage decay, and voltage decay becomes a long-term distress of LRMOs. Therefore, it is particularly crucial to sort out the mutual relation of various mechanisms, which helps to go back to the source of voltage decay. In this review, we summarize the current mechanisms of voltage decay as structural evolution and oxygen chemistry, and attempt to trace the origin of voltage decay for LRMOs. In addition, we discuss how current researches address the issue with generalized guidance in designing appropriate strategies based on mechanisms.</p></div>","PeriodicalId":100007,"journal":{"name":"AAPPS Bulletin","volume":"34 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s43673-024-00138-2.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"AAPPS Bulletin","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1007/s43673-024-00138-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

To satisfy the needs of modern intelligent society for power supplies with long-endurance ability, Li-rich Mn-based layered oxides (LRMOs) are receiving much attention because of their ultrahigh capacity. However, their real-world implementation is hindered by the serious voltage decay, which results in a continuous decrease in energy density. The understanding on voltage decay still remains a mystery due to the complicated hybrid cationic-anionic redox and the serious surface-interface reactions in LRMOs. Moreover, some of the mechanisms are occasionally contradictory, indicating that the origin of voltage decay is still unclear. As a result, none of the innovative strategies proposed on the basis of mechanisms has effectively alleviated the problem of voltage decay, and voltage decay becomes a long-term distress of LRMOs. Therefore, it is particularly crucial to sort out the mutual relation of various mechanisms, which helps to go back to the source of voltage decay. In this review, we summarize the current mechanisms of voltage decay as structural evolution and oxygen chemistry, and attempt to trace the origin of voltage decay for LRMOs. In addition, we discuss how current researches address the issue with generalized guidance in designing appropriate strategies based on mechanisms.

对富锂锰基层状氧化物阴极材料电压衰减的基本认识
为满足现代智能社会对长寿命电源的需求,富锂锰基层状氧化物(LRMO)因其超高容量而备受关注。然而,由于电压衰减严重,导致能量密度持续下降,阻碍了它们在现实世界中的应用。由于 LRMOs 中存在复杂的阳离子-阴离子混合氧化还原反应和严重的表面-界面反应,人们对电压衰减的理解仍然是一个谜。此外,一些机制偶尔会出现矛盾,这表明电压衰减的起源仍不清楚。因此,基于机理提出的创新策略都未能有效缓解电压衰减问题,电压衰减成为 LRMOs 的长期困扰。因此,理清各种机制之间的相互关系,有助于追溯电压衰减的源头,显得尤为重要。在这篇综述中,我们将电压衰减的现有机制归纳为结构演化和氧化学,并试图追溯 LRMO 电压衰减的起源。此外,我们还讨论了当前的研究如何解决这一问题,并根据机制为设计适当的策略提供了一般性指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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