Features of Spherical X-Ray Wave Diffraction by a Low Angle Twist Boundary Perpendicular to the Crystal Surface

Abstract

An X-ray point source was used to examine the diffraction behavior of a low-angle twist boundary. It is shown that when radiation is focused inside a crystal, because of the dislocation structure of the defect wall, the vertical divergence can be reduced so much that the size of the focus in this direction is significantly smaller than in the horizontal direction. This circumstance can be used to create X-ray optical elements.