Jacob Ward, Mark Damante, Seth Wilson, Vicente Coelho, Dominic Franceschelli, Ahmed Nader Elguindy, Evan M Thomas, Simeng Zhu, Dukagjin Blakaj, Sasha Beyer, Raju Raval, Raj Singh, David S Xu, J Bradley Elder, Joshua D Palmer, Vikram B Chakravarthy
{"title":"Correction to: Impact of instrumentation material on local recurrence: a case-matched series using carbon fiber-PEEK vs. titanium.","authors":"Jacob Ward, Mark Damante, Seth Wilson, Vicente Coelho, Dominic Franceschelli, Ahmed Nader Elguindy, Evan M Thomas, Simeng Zhu, Dukagjin Blakaj, Sasha Beyer, Raju Raval, Raj Singh, David S Xu, J Bradley Elder, Joshua D Palmer, Vikram B Chakravarthy","doi":"10.1007/s11060-024-04860-7","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.1007/s11060-024-04860-7","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}