Effect of doping with M (M=Al, Pd, Ti, Ge) on the electronic structure and hydrogen diffusion behavior of amorphous silicon

IF 3 3区 化学 Q3 CHEMISTRY, PHYSICAL
Zongkun Bian, Qiankun Zhang, Haimin Zhang, Fuling Tang, Zhewen Ma, Xuan Lan, Yongchun Luo
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引用次数: 0

Abstract

Amorphous silicon (a-Si) models doped with Pd, Ge, Al, and Ti (a-Si/M) at three different doping ratios are generated using Ab initio Molecular Dynamics (AIMD) high-temperature annealing, followed by analysis utilizing first-principles method. The electronic structure calculations reveal strong interactions between Al, Ge and Si, while interaction between Pd, Ti and Si are relatively weak. Moderate doping of Pd and Ti can reconstruct the a-Si surface, reduce the adsorption energy of H on the surface, and increase the Si-Si atomic gap. This will greatly reduce the energy barrier for H to diffuse on the surface and to the subsurface.

Abstract Image

掺杂 M(M=Al、Pd、Ti、Ge)对非晶硅电子结构和氢扩散行为的影响
利用 Ab initio 分子动力学(AIMD)高温退火法生成了三种不同掺杂比的掺杂钯、锗、铝和钛(a-Si/M)的非晶硅(a-Si)模型,然后利用第一原理方法进行了分析。电子结构计算显示,Al、Ge 和 Si 之间的相互作用很强,而 Pd、Ti 和 Si 之间的相互作用相对较弱。适度掺杂 Pd 和 Ti 可以重构 a-Si 表面,降低 H 在表面的吸附能,并增大 Si-Si 原子间隙。这将大大降低 H 在表面和向次表面扩散的能量障碍。
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来源期刊
CiteScore
4.20
自引率
10.70%
发文量
331
审稿时长
31 days
期刊介绍: Computational and Theoretical Chemistry publishes high quality, original reports of significance in computational and theoretical chemistry including those that deal with problems of structure, properties, energetics, weak interactions, reaction mechanisms, catalysis, and reaction rates involving atoms, molecules, clusters, surfaces, and bulk matter.
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