X-ray induced grain boundary formation and grain rotation in Bi2Se3

IF 5.3 2区材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY

Scripta Materialia Pub Date : 2024-10-22 DOI:10.1016/j.scriptamat.2024.116416

Kento Katagiri , Bernard Kozioziemski , Eric Folsom , Sebastian Göde , Yifan Wang , Karen Appel , Darshan Chalise , Philip K. Cook , Jon Eggert , Marylesa Howard , Sungwon Kim , Zuzana Konôpková , Mikako Makita , Motoaki Nakatsutsumi , Martin M. Nielsen , Alexander Pelka , Henning F. Poulsen , Thomas R. Preston , Tharun Reddy , Jan-Patrick Schwinkendorf , Leora E. Dresselhaus-Marais

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引用次数: 0

Abstract

Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi₂Se₃) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous transmission X-ray microscopy and X-ray diffraction demonstrate how intense X-ray radiation can rapidly change size and texture of grains.

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X 射线诱导的 Bi2Se3 晶界形成和晶粒旋转

优化多晶材料的晶界特性可以改善其性能。目前已开发出许多用于晶界处理的加工方法，包括在某些应用中使用强辐射。在这项工作中，我们使用 X 射线自由电子激光脉冲辐照单晶硒化铋（Bi2Se3），并观察了晶界的形成以及随后晶粒在 X 射线辐射下的旋转。我们利用透射 X 射线显微镜和 X 射线衍射同时进行的观察表明，强烈的 X 射线辐射可以迅速改变晶粒的尺寸和纹理。

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来源期刊

Scripta Materialia 工程技术-材料科学：综合

CiteScore

11.40

自引率

5.00%

发文量

581

审稿时长

34 days

期刊介绍： Scripta Materialia is a LETTERS journal of Acta Materialia, providing a forum for the rapid publication of short communications on the relationship between the structure and the properties of inorganic materials. The emphasis is on originality rather than incremental research. Short reports on the development of materials with novel or substantially improved properties are also welcomed. Emphasis is on either the functional or mechanical behavior of metals, ceramics and semiconductors at all length scales.