Excellent microwave absorption performance of zinc-doped SrFe12O19 hexaferrite and detailed loss mechanism

IF 6.7 3区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
N.L. Tuyen , N.T. Hue , P.T. Tho , H.N. Toan , C.T.A. Xuan , N.V. Dang , T.A. Ho , N.Q. Tuan , N. Tran
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Abstract

In this work, the SrFe12–xZnxO19 (Zn-SrM, x = 0, 0.1, 0.4, and 1.0) samples were fabricated using a combination of ball milling and heat treatment methods, which was simple and low-cost. Interestingly, the Zn-SrM samples exhibited great microwave absorption performances with an absorption rate of more than 99.99% and very thin thicknesses. The x = 0.1 sample could reach an excellent RL value of −40.08 dB at f = 17.88 GHz for a thickness of 1.45 mm. The x = 0.4 sample achieved a great RL value of −42.51 dB at 17.86 GHz and an EAB value of 1.29 GHz for t = 1.50 mm. With a thickness of 5.1 mm, the x = 1.0 sample could achieve a great RL value of −51.20 dB and an EAB value of 1.58 GHz. This microwave absorption performance, low cost, and simplicity of fabrication could confirm that Zn-SrM samples could be used as high-efficiency MAMs. The great microwave dissipating characteristics could be attributed to the high values of imaginary parts of complex permeability and complex permittivity leading to the high loss tangent, high degree of impedance matching, high values of attenuation constant and conductivity, suitable values of eddy current factor, and large numbers of semicircles in their Cole-Cole plots.
掺锌 SrFe12O19 六价铁氧体的优异微波吸收性能及详细损耗机制
在这项工作中,采用球磨和热处理相结合的方法制备了 SrFe12-xZnxO19 (Zn-SrM,x = 0、0.1、0.4 和 1.0)样品,这种方法简单且成本低廉。有趣的是,Zn-SrM 样品具有很好的微波吸收性能,吸收率超过 99.99%,厚度非常薄。厚度为 1.45 毫米的 x = 0.1 样品在 f = 17.88 GHz 频率下的 RL 值为 -40.08 dB。x = 0.4 样品在 17.86 GHz 时的 RL 值为 -42.51 dB,t = 1.50 mm 时的 EAB 值为 1.29 GHz。厚度为 5.1 毫米时,x = 1.0 样品的 RL 值为 -51.20 dB,EAB 值为 1.58 GHz。Zn-SrM样品的微波吸收性能、低成本和简单的制造工艺证实了它可以用作高效MAM。Zn-SrM样品的高微波耗散特性可归因于复磁导率和复介电常数的高虚部值导致的高损耗正切、高阻抗匹配度、高衰减常数和电导率值、合适的涡流因子值以及其科尔-科尔图中的大量半圆。
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来源期刊
Journal of Science: Advanced Materials and Devices
Journal of Science: Advanced Materials and Devices Materials Science-Electronic, Optical and Magnetic Materials
CiteScore
11.90
自引率
2.50%
发文量
88
审稿时长
47 days
期刊介绍: In 1985, the Journal of Science was founded as a platform for publishing national and international research papers across various disciplines, including natural sciences, technology, social sciences, and humanities. Over the years, the journal has experienced remarkable growth in terms of quality, size, and scope. Today, it encompasses a diverse range of publications dedicated to academic research. Considering the rapid expansion of materials science, we are pleased to introduce the Journal of Science: Advanced Materials and Devices. This new addition to our journal series offers researchers an exciting opportunity to publish their work on all aspects of materials science and technology within the esteemed Journal of Science. With this development, we aim to revolutionize the way research in materials science is expressed and organized, further strengthening our commitment to promoting outstanding research across various scientific and technological fields.
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