{"title":"A Sensitivity-Based Algorithm Approach in Reconstructing Images in Electrical Impedance Tomography","authors":"Rose Anne D. Alas;Arrianne Crystal T. Velasco","doi":"10.1109/ACCESS.2024.3473616","DOIUrl":null,"url":null,"abstract":"Electrical impedance tomography (EIT) is a medical imaging technique used to reconstruct images inside the domain of interest. EIT collects data on the boundary of the domain to infer the conductivity distribution inside the domain. The conductivity distribution will then be used to produce a tomographic image of the inside of the domain. This paper aims to recover geometric properties of a spherical perturbation in the conductivity inside a domain using sensitivity values of the electric potential on the boundary of the domain. The continuum model for EIT is first considered, as it holds more boundary information compared to other models of EIT. A change on the conductivity inside the domain is applied, and the impact on the electric potential is studied. The inverse EIT problem is then solved by formulating relations between the sensitivity values on the boundary and the geometric properties of the spherical perturbation: the radius and the projection onto the boundary and depth of its center. A reconstruction method using these relations is proposed and the method is examined by performing numerical simulations on different domains to model the head and the thorax. Lastly, the proposed method is applied to the complete electrode model of the EIT problem to analyze the performance of the method when the boundary data is limited on the electrodes.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"12 ","pages":"146560-146574"},"PeriodicalIF":3.4000,"publicationDate":"2024-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10704621","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10704621/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Electrical impedance tomography (EIT) is a medical imaging technique used to reconstruct images inside the domain of interest. EIT collects data on the boundary of the domain to infer the conductivity distribution inside the domain. The conductivity distribution will then be used to produce a tomographic image of the inside of the domain. This paper aims to recover geometric properties of a spherical perturbation in the conductivity inside a domain using sensitivity values of the electric potential on the boundary of the domain. The continuum model for EIT is first considered, as it holds more boundary information compared to other models of EIT. A change on the conductivity inside the domain is applied, and the impact on the electric potential is studied. The inverse EIT problem is then solved by formulating relations between the sensitivity values on the boundary and the geometric properties of the spherical perturbation: the radius and the projection onto the boundary and depth of its center. A reconstruction method using these relations is proposed and the method is examined by performing numerical simulations on different domains to model the head and the thorax. Lastly, the proposed method is applied to the complete electrode model of the EIT problem to analyze the performance of the method when the boundary data is limited on the electrodes.
电阻抗断层扫描(EIT)是一种医学成像技术,用于重建相关域内的图像。电阻抗断层扫描收集畴边界上的数据,以推断畴内部的电导率分布。然后,导电率分布将用于生成域内部的断层图像。本文旨在利用畴边界上电动势的灵敏度值,恢复畴内电导率球形扰动的几何特性。首先考虑的是 EIT 的连续体模型,因为与其他 EIT 模型相比,该模型拥有更多的边界信息。对域内电导率的变化进行应用,并研究其对电动势的影响。然后,通过制定边界上的灵敏度值与球形扰动的几何特性(半径、边界投影及其中心深度)之间的关系来解决逆 EIT 问题。利用这些关系提出了一种重建方法,并通过在不同域上对头部和胸部模型进行数值模拟来检验该方法。最后,将提出的方法应用于 EIT 问题的完整电极模型,以分析当电极上的边界数据有限时该方法的性能。
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
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