The Theory of Axial Tomography Based on the Inverse Radon Transform for High-Aperture Soft X-ray Microscopy

IF 1.1 4区物理与天体物理 Q4 PHYSICS, APPLIED

Technical Physics Pub Date : 2024-09-26 DOI:10.1134/S1063784224060124

K. P. Gaikovich, I. V. Malyshev, D. G. Reunov, N. I. Chkhalo

引用次数: 0

Abstract

For soft X-ray microscopy in the approximation of geometrical optics, a theoretical model for the formation of the received image is constructed – a relationship is found between the image recorded on the detector and the 3D distribution of the sample absorption index using a high-aperture mirror objective (NA ¿ 0.3) with a focus depth close to the diffraction limit. The solution of the inverse problem of tomography for determining this 3D distribution from the data of measurements in a high-aperture mirror SXR-microscope is obtained.

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基于反氡变换的轴向断层扫描理论用于高孔径软 X 射线显微镜

在近似几何光学的软 X 射线显微镜中，构建了接收图像形成的理论模型--使用聚焦深度接近衍射极限的高孔径镜物镜（NA ¿ 0.3），发现探测器上记录的图像与样品吸收指数的三维分布之间的关系。从高孔径镜 SXR 显微镜的测量数据中确定该三维分布的层析成像反问题的解决方案已经获得。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Technical Physics 物理-物理：应用

CiteScore

1.30

自引率

14.30%

发文量

139

审稿时长

3-6 weeks

期刊介绍： Technical Physics is a journal that contains practical information on all aspects of applied physics, especially instrumentation and measurement techniques. Particular emphasis is put on plasma physics and related fields such as studies of charged particles in electromagnetic fields, synchrotron radiation, electron and ion beams, gas lasers and discharges. Other journal topics are the properties of condensed matter, including semiconductors, superconductors, gases, liquids, and different materials.