Testing Semiconductor Products Using Low-Frequency Noise Parameters

IF 0.9 4区 材料科学 Q4 MATERIALS SCIENCE, CHARACTERIZATION & TESTING
M. I. Gorlov, V. A. Sergeev
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引用次数: 0

Abstract

This article continues and supplements the article with the same title published in Russian Journal of Nondestructive Testing, no. 1, 2022, which provides six ways to assess the quality and reliability of semiconductor products (SCPs) using low-frequency (LF) noise parameters. This paper presents a generalization of the results previously obtained by the authors and describes four more methods for diagnosing and evaluating the reliability of SCPs by varying the parameters of low- frequency noise under additional external influences such as electrostatic discharge and (or) thermal annealing. It is shown that additional impacts make it possible to increase the reliability of the assessment of the SCP reliability.

Abstract Image

使用低频噪声参数测试半导体产品
本文是对《俄罗斯无损检测杂志》(Russian Journal of Nondestructive Testing)2022 年第 1 期发表的同名文章的延续和补充,该文章提供了使用低频(LF)噪声参数评估半导体产品(SCP)质量和可靠性的六种方法。本文概括了作者之前取得的成果,并介绍了另外四种诊断和评估 SCP 可靠性的方法,即在静电放电和(或)热退火等额外外部影响下改变低频噪声参数。结果表明,附加影响可以提高 SCP 可靠性评估的可靠性。
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来源期刊
Russian Journal of Nondestructive Testing
Russian Journal of Nondestructive Testing 工程技术-材料科学:表征与测试
CiteScore
1.60
自引率
44.40%
发文量
59
审稿时长
6-12 weeks
期刊介绍: Russian Journal of Nondestructive Testing, a translation of Defectoskopiya, is a publication of the Russian Academy of Sciences. This publication offers current Russian research on the theory and technology of nondestructive testing of materials and components. It describes laboratory and industrial investigations of devices and instrumentation and provides reviews of new equipment developed for series manufacture. Articles cover all physical methods of nondestructive testing, including magnetic and electrical; ultrasonic; X-ray and Y-ray; capillary; liquid (color luminescence), and radio (for materials of low conductivity).
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