Mohamed El Hacen Habib;Ayhan Küçükmanisa;Oǧuzhan Urhan
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引用次数: 0
Abstract
Few-Shot Learning (FSL) has recently gained increased attention for its effectiveness in addressing the problem of data scarcity. Many approaches have been proposed based on the FSL idea, including prototypical networks (ProtoNet). ProtoNet demonstrates its effectiveness in overcoming this issue while providing simplicity in its architecture. On the other hand, the self-knowledge distillation (SKD) technique has become popular in assisting FSL models in achieving good performance by transferring knowledge gained from additional training data. In this work, we apply the self-knowledge distillation technique to ProtoNet to boost its performance. For each task, we compute the prototypes from the few examples (local prototypes) and the many examples (global prototypes) and use the global prototypes to distill knowledge to the few-shot learner model. We employ different distillation techniques based on prototypes, logits, and predictions (soft labels). We evaluated our method using three popular FSL image classification benchmark datasets: CIFAR-FS, CIFAR-FC100, and miniImageNet. Our approach outperformed the baseline and achieved competitive results compared to the state-of-the-art methods, especially on the CIFAR-FC100 dataset.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.