The promise of GaAs 200 in small-angle neutron scattering for higher resolution.

IF 6.1 3区材料科学 Q1 Biochemistry, Genetics and Molecular Biology

Journal of Applied Crystallography Pub Date : 2024-08-27 eCollection Date: 2024-10-01 DOI:10.1107/S1600576724007246

A Magerl, H Lemmel, M Appel, M Weisser, U Kretzer, M Zobel

引用次数: 0

Abstract

The Q resolution in Bonse-Hart double-crystal diffractometers is determined for a given Bragg angle by the value of the crystallographic structure factor. To date, the reflections Si 220 or Si 111 have been used exclusively in neutron scattering, which provide resolutions for triple-bounce crystals of about 2 × 10^-5 Å^-1 (FWHM). The Darwin width of the GaAs 200 reflection is about a factor of 10 smaller, offering the possibility of a Q resolution of 2 × 10^-6 Å^-1 provided crystals of sufficient quality are available. This article reports a feasibility study with single-bounce GaAs 200, yielding a Q resolution of 4.6 × 10^-6 Å^-1, six times superior in comparison with a Si 220 setup.

查看原文本刊更多论文

GaAs 200 在小角中子散射中有望实现更高分辨率。

对于给定的布拉格角，Bonse-Hart 双晶衍射仪的 Q 分辨率由晶体结构因子值决定。迄今为止，Si 220 或 Si 111 反射只用于中子散射，它们提供的三弹晶体分辨率约为 2 × 10-5 Å-1（FWHM）。GaAs 200 反射的达尔文宽度要小 10 倍左右，如果有足够质量的晶体，Q 分辨率有可能达到 2 × 10-6 Å-1。本文报告了使用单跳砷化镓 200 进行的可行性研究，得出的 Q 值分辨率为 4.6 × 10-6 Å-1，是硅 220 设置的六倍。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Journal of Applied Crystallography 化学-晶体学

CiteScore

10.00

自引率

3.30%

发文量

178

审稿时长

4.7 months

期刊介绍： Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.