Electronic angle focusing for neutron time-of-flight powder diffractometers.

IF 6.1 3区材料科学 Q1 Biochemistry, Genetics and Molecular Biology

Journal of Applied Crystallography Pub Date : 2024-10-01 DOI:10.1107/S1600576724008756

Robert B Von Dreele

引用次数: 0

Abstract

A neutron time-of-flight (TOF) powder diffractometer with a continuous wide-angle array of detectors can be electronically focused to make a single pseudo-constant wavelength diffraction pattern, thus facilitating angle-dependent intensity corrections. The resulting powder diffraction peak profiles are affected by the neutron source emission profile and resemble the function currently used for TOF diffraction.

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用于中子飞行时间粉末衍射仪的电子角聚焦。

带有连续广角探测器阵列的中子飞行时间（TOF）粉末衍射仪可以通过电子聚焦来制作单一的伪恒定波长衍射图样，从而便于根据角度进行强度校正。由此产生的粉末衍射峰轮廓受中子源发射轮廓的影响，类似于目前用于 TOF 衍射的函数。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Applied Crystallography 化学-晶体学

CiteScore

10.00

自引率

3.30%

发文量

178

审稿时长

4.7 months

期刊介绍： Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.