Sebastian Schäfer , François Willot , Hrishikesh Bale , Mansoureh Norouzi Rad , Stephen T. Kelly , Dirk Enke , Juliana Martins de Souza e Silva
{"title":"Intermittent in-situ high-resolution X-ray microscopy of 400-nm porous glass under uniaxial compression: Study of pore changes and crack formation","authors":"Sebastian Schäfer , François Willot , Hrishikesh Bale , Mansoureh Norouzi Rad , Stephen T. Kelly , Dirk Enke , Juliana Martins de Souza e Silva","doi":"10.1016/j.scriptamat.2024.116396","DOIUrl":null,"url":null,"abstract":"<div><div>Understanding the relationship between the structure of porous glasses and their failure behavior is crucial for developing reliable porous glasses for specific applications. In this study, we used nanometer resolution X-ray computed tomography (nano-CT) to image a controlled pore glass (CPG) with 400 nm-sized pores under <em>in-situ</em> uniaxial compression. Our results demonstrate that <em>in-situ</em> nano-CT is an excellent tool for identifying damage mechanisms in 400 nm pore glass. It allowed us to track changes in the shape of pores and pore walls during compression until the specimen failed. We also used computational tools to analyze the microstructural changes within the CPG sample, mapping displacements and strain fields. Additionally, we simulated the behavior of the CPG using a Fast Fourier Transform/Phase Field method. Both experimental and numerical data revealed local shear deformation occurring along bands, consistent with the appearance and propagation of ± 45-degree cracks.</div></div>","PeriodicalId":423,"journal":{"name":"Scripta Materialia","volume":"255 ","pages":"Article 116396"},"PeriodicalIF":5.3000,"publicationDate":"2024-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scripta Materialia","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1359646224004317","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Understanding the relationship between the structure of porous glasses and their failure behavior is crucial for developing reliable porous glasses for specific applications. In this study, we used nanometer resolution X-ray computed tomography (nano-CT) to image a controlled pore glass (CPG) with 400 nm-sized pores under in-situ uniaxial compression. Our results demonstrate that in-situ nano-CT is an excellent tool for identifying damage mechanisms in 400 nm pore glass. It allowed us to track changes in the shape of pores and pore walls during compression until the specimen failed. We also used computational tools to analyze the microstructural changes within the CPG sample, mapping displacements and strain fields. Additionally, we simulated the behavior of the CPG using a Fast Fourier Transform/Phase Field method. Both experimental and numerical data revealed local shear deformation occurring along bands, consistent with the appearance and propagation of ± 45-degree cracks.
期刊介绍:
Scripta Materialia is a LETTERS journal of Acta Materialia, providing a forum for the rapid publication of short communications on the relationship between the structure and the properties of inorganic materials. The emphasis is on originality rather than incremental research. Short reports on the development of materials with novel or substantially improved properties are also welcomed. Emphasis is on either the functional or mechanical behavior of metals, ceramics and semiconductors at all length scales.