A biology-inspired model for the electrical response of solid state memristors

Agustin Bou, Cedric Gonzales, Pablo P. Boix, Antonio Guerrero, Juan Bisquert
{"title":"A biology-inspired model for the electrical response of solid state memristors","authors":"Agustin Bou, Cedric Gonzales, Pablo P. Boix, Antonio Guerrero, Juan Bisquert","doi":"arxiv-2409.09307","DOIUrl":null,"url":null,"abstract":"Memristors stand out as promising components in the landscape of memory and\ncomputing. Memristors are generally defined by a conductance equation\ncontaining a state variable that imparts a memory effect. The current-voltage\ncycling causes transitions of the conductance, determined by different physical\nmechanisms such as the formation of conducting filaments in an insulating\nsurrounding. Here we provide a unified description of the set and reset\nprocesses, by means of a single voltage activated relaxation time of the memory\nvariable. This approach is based on the Hodgkin-Huxley model that is widely\nused to describe action potentials dynamics in neurons. We focus on halide\nperovskite memristors and their intersection with neuroscience-inspired\ncomputing. We show that the modelling approach adeptly replicates the\nexperimental traits of both volatile and nonvolatile memristors. Its\nversatility extends across various device materials and configurations,\ncapturing nuanced behaviors such as scan rate- and upper vertex-dependence. The\nmodel also describes well the response to sequences of voltage pulses that\ncause synaptic potentiation effects. This model serves as a potent tool for\ncomprehending and probing the underlying mechanisms of memristors, by\nindicating the relaxation properties that control observable response, which\nopens the way for a detailed physical interpretation.","PeriodicalId":501083,"journal":{"name":"arXiv - PHYS - Applied Physics","volume":"2 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.09307","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Memristors stand out as promising components in the landscape of memory and computing. Memristors are generally defined by a conductance equation containing a state variable that imparts a memory effect. The current-voltage cycling causes transitions of the conductance, determined by different physical mechanisms such as the formation of conducting filaments in an insulating surrounding. Here we provide a unified description of the set and reset processes, by means of a single voltage activated relaxation time of the memory variable. This approach is based on the Hodgkin-Huxley model that is widely used to describe action potentials dynamics in neurons. We focus on halide perovskite memristors and their intersection with neuroscience-inspired computing. We show that the modelling approach adeptly replicates the experimental traits of both volatile and nonvolatile memristors. Its versatility extends across various device materials and configurations, capturing nuanced behaviors such as scan rate- and upper vertex-dependence. The model also describes well the response to sequences of voltage pulses that cause synaptic potentiation effects. This model serves as a potent tool for comprehending and probing the underlying mechanisms of memristors, by indicating the relaxation properties that control observable response, which opens the way for a detailed physical interpretation.
固态忆阻器电气响应的生物启发模型
忆阻器是存储器和计算领域前景广阔的元件。忆阻器一般由电导方程定义,其中包含一个具有记忆效应的状态变量。电流-电压循环会导致电导率的变化,而电导率的变化是由不同的物理机制决定的,例如绝缘层中导电丝的形成。在这里,我们通过记忆变量的单一电压激活弛豫时间,对设定和复位过程进行了统一描述。这种方法基于霍奇金-赫胥黎模型,该模型被广泛用于描述神经元的动作电位动力学。我们重点研究了卤代磷灰石忆阻器及其与神经科学启发计算的交集。我们的研究表明,建模方法能够很好地复制挥发性和非挥发性忆阻器的实验特征。它的通用性扩展到各种器件材料和配置,捕捉到了细微的行为,如扫描速率和上顶点依赖性。该模型还很好地描述了引起突触电位效应的电压脉冲序列的响应。该模型指出了控制可观测响应的弛豫特性,为详细的物理解释开辟了道路,是理解和探究忆阻器潜在机制的有力工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信