Real-time observation of frustrated ultrafast recovery from ionisation in nanostructured SiO2 using laser driven accelerators

J. P. Kennedy, M. Coughlan, C. R. J. Fitzpatrick, H. M. Huddleston, J. Smyth, N. Breslin, H. Donnelly, C. Arthur, B. Villagomez, O. N. Rosmej, F. Currell, L. Stella, D. Riley, M. Zepf, M. Yeung, C. L. S. Lewis, B. Dromey
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Abstract

Ionising radiation interactions in matter can trigger a cascade of processes that underpin long-lived damage in the medium. To date, however, a lack of suitable methodologies has precluded our ability to understand the role that material nanostructure plays in this cascade. Here, we use transient photoabsorption to track the lifetime of free electrons (t_c) in bulk and nanostructured SiO2 (aerogel) irradiated by picosecond-scale (10^-12 s) bursts of X-rays and protons from a laser-driven accelerator. Optical streaking reveals a sharp increase in t_c from < 1 ps to > 50 ps over a narrow average density (p_av) range spanning the expected phonon-fracton crossover in aerogels. Numerical modelling suggests that this discontinuity can be understood by a quenching of rapid, phonon-assisted recovery in irradiated nanostructured SiO_2. This is shown to lead to an extended period of enhanced energy density in the excited electron population. Overall, these results open a direct route to tracking how low-level processes in complex systems can underpin macroscopically observed phenomena and, importantly, the conditions that permit them to emerge.
利用激光驱动加速器实时观测纳米结构二氧化硅电离后的受挫超快恢复情况
电离辐射在物质中的相互作用会引发一系列过程,这些过程是介质中长期损伤的基础。然而,迄今为止,由于缺乏合适的方法,我们无法了解材料纳米结构在这一级联过程中所起的作用。在这里,我们使用瞬态光吸收技术来跟踪自由电子(t_c)在由激光驱动的加速器发出的皮秒级(10^-12 秒)X 射线和质子束辐照的块状二氧化硅(气凝胶)和纳米结构二氧化硅(气凝胶)中的寿命。光学条纹显示,在平均密度(p_av)的狭窄范围内,t_c 从 < 1 ps 急剧上升到 > 50 ps,跨越了预期的声子-分 子交叉。数值建模表明,这种不连续性可以通过辐照纳米结构 SiO_2 中快速声子辅助恢复的淬灭来理解。结果表明,这将导致激发电子群的能量密度增强期延长。总之,这些结果为追踪复杂系统中的低级过程如何支撑宏观观察到的现象,以及重要的是允许这些现象出现的条件开辟了一条直接途径。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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