Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography

IF 2.1 3区 工程技术 Q2 MICROSCOPY
Patrick Harrison , Saurabh Mohan Das , William Goncalves , Alessandra da Silva , Xinren Chen , Nicola Viganò , Christian H. Liebscher , Wolfgang Ludwig , Xuyang Zhou , Edgar F. Rauch
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Abstract

Determining the full five-parameter grain boundary characteristics from experiments is essential for understanding grain boundaries impact on material properties, improving related models, and designing advanced alloys. However, achieving this is generally challenging, in particular at nanoscale, due to their 3D nature. In our study, we successfully determined the grain boundary characteristics of an annealed nickel-tungsten alloy (NiW) nanocrystalline needle-shaped specimen (tip) containing twins using Scanning Precession Electron Diffraction (SPED) Tomography. The presence of annealing twins in this face-centered cubic (fcc) material gives rise to common reflections in the SPED diffraction patterns, which challenges the reconstruction of orientation-specific virtual dark field (VDF) images required for tomographic reconstruction of the 3D grain shapes. To address this, an automated post-processing step identifies and deselects these shared reflections prior to the reconstruction of the VDF images. Combined with appropriate intensity normalization and projection alignment procedures, this approach enables high-fidelity 3D reconstruction of the individual grains contained in the needle-shaped sample volume. To probe the accuracy of the resulting boundary characteristics, the twin boundary surface normal directions were extracted from the 3D voxelated grain boundary map using a 3D Hough transform. For the sub-set of coherent Σ3 boundaries, the expected {111} grain boundary plane normals were obtained with an angular error of <3° for boundary sizes down to 400 nm². This work advances our ability to precisely characterize and understand the complex grain boundaries that govern material properties.

利用扫描前驱电子衍射层析技术测定纳米晶 Ni-W 中的五参数晶界特征
从实验中确定完整的五参数晶界特性对于了解晶界对材料特性的影响、改进相关模型和设计先进合金至关重要。然而,由于晶界的三维性质,实现这一目标通常具有挑战性,尤其是在纳米尺度上。在我们的研究中,我们利用扫描前序电子衍射 (SPED) 层析技术成功测定了含有孪晶的退火镍钨合金(NiW)纳米晶针状试样(尖端)的晶界特征。这种面心立方(fcc)材料中存在退火孪晶,导致 SPED 衍射图样中出现共同反射,这给重建三维晶粒形状断层扫描所需的特定取向虚拟暗场(VDF)图像带来了挑战。为了解决这个问题,在重建 VDF 图像之前,一个自动化的后处理步骤会识别并取消选择这些共用反射。结合适当的强度归一化和投影对齐程序,这种方法能够高保真地重建针形样品体积中包含的单个晶粒的三维图像。为了探测所得到的边界特征的准确性,使用三维 Hough 变换从三维体素化晶粒边界图中提取了孪生边界表面法线方向。对于相干 Σ3 边界子集,获得了预期的{111}晶粒边界平面法线,其角度误差为 <3°,边界尺寸小至 400 nm²。这项工作提高了我们精确表征和理解影响材料特性的复杂晶界的能力。
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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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