Application of the GIXRD Technique to Investigation of Damaged Layers in NaNd(WO4)2 and NaNd(MoO4)2 Ceramics Irradiated with High-Energy Ions

IF 1.1 4区物理与天体物理 Q4 PHYSICS, APPLIED

Technical Physics Pub Date : 2024-09-02 DOI:10.1134/s1063784224010432

P. A. Yunin, A. A. Nazarov, E. A. Potanina

引用次数: 0

Abstract

The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO₄)₂ and NaNd(MoO₄)₂ ceramics irradiated with high-energy ions. The possibilities and applicability limits of the technique for the analysis of such samples are shown. Estimates of the degree of amorphization in near-surface layers of ceramics are given depending on the irradiation dose. The higher resistance of NaNd(MoO₄)₂ ceramics to external radiation exposure as compared to NaNd(WO₄)₂ has been demonstrated.

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应用 GIXRD 技术研究高能离子辐照下 NaNd(WO4)2 和 NaNd(MoO4)2 陶瓷中的损伤层

摘要利用掠入射 X 射线衍射仪 (GIXRD) 技术研究了用高能离子照射的 NaNd(WO4)2 和 NaNd(MoO4)2 陶瓷中的受损层。结果表明了该技术分析此类样品的可能性和适用范围。根据辐照剂量，对陶瓷近表层的非晶化程度进行了估算。与 NaNd(WO4)2 相比，NaNd(MoO4)2 陶瓷对外部辐照的耐受性更高。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Technical Physics 物理-物理：应用

CiteScore

1.30

自引率

14.30%

发文量

139

审稿时长

3-6 weeks

期刊介绍： Technical Physics is a journal that contains practical information on all aspects of applied physics, especially instrumentation and measurement techniques. Particular emphasis is put on plasma physics and related fields such as studies of charged particles in electromagnetic fields, synchrotron radiation, electron and ion beams, gas lasers and discharges. Other journal topics are the properties of condensed matter, including semiconductors, superconductors, gases, liquids, and different materials.