A. V. Irodova, E. A. Golovkova, O. A. Kondratiev, V. S. Kruglov, V. E. Krylov, S. A. Tikhomirov, S. V. Shavkin
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引用次数: 0
Abstract
Using X-ray diffraction, there were determined the residual stresses on the surface of the AISI 310S stainless steel carrier tape used in manufacture of the second generation high temperature superconducting (2G HTS) wires at the National Research Center “Kurchatov Institute,” from delivery to deposition of the main buffer layer YSZ between the tape and the superconducting layer, and the residual stress in the buffer layer YSZ itself. The compressive stress of –0.8 GPa induced by rolling was found on the surface of the tape as-delivered. During processing, it varies from –0.5 to –1.1 GPa. At each stage, its depth distribution was found down to 10 μm, and the residual stresses caused by processing were determined. The residual stress in the YSZ layer deposited using the ABAD technology is compressive and amounts to –3.29 GPa. The layer has a defective single-crystal structure in type to radiation swelling with the unstressed lattice period of 5.1820 Å, 0.9% larger than in ordinary crystal. The results obtained are in agreement with the data of the earlier neutron diffraction study of residual stresses inside the carrier tape.
期刊介绍：
Technical Physics is a journal that contains practical information on all aspects of applied physics, especially instrumentation and measurement techniques. Particular emphasis is put on plasma physics and related fields such as studies of charged particles in electromagnetic fields, synchrotron radiation, electron and ion beams, gas lasers and discharges. Other journal topics are the properties of condensed matter, including semiconductors, superconductors, gases, liquids, and different materials.
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