Electronvolt energy resolution with broadband ptychography

Silvia Cipiccia, Wiebe Stolp, Luca Fardin, Ralf Ziesche, Ingo Manke, Matthieu Boone, Chris Armstrong, Joachim R. Binder, Nicole Bohn, Alessandro Olivo, Darren Batey
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Abstract

Ptychography is a scanning coherent diffraction imaging technique successfully applied in the electron, visible and x-ray regimes. One of the distinct features of ptychography with respect to other coherent diffraction techniques is its capability of dealing with partial spatial and temporal coherence via the reconstruction algorithm. Here we focus on the temporal and clarify the constraints which affect the energy resolution limits of the ptychographic algorithms. Based on this, we design and perform simulations for a broadband ptychography in the hard x-ray regime, which enables an energy resolution down to 1 eV. We benchmark the simulations against experimental ptychographic data of an NMC battery cathode material, attaining an energy resolution of 5 eV. We review the results, discuss the limitations, and provide guidelines for future broadband ptychography experiments, its prospective application for single acquisition x-ray absorption near edge structure imaging, magnetic dichroism imaging, and potential impact on achieving diffraction limited resolutions.
电子伏特能量分辨率与宽带层析成像技术
层析成像技术是一种扫描相干衍射成像技术,已成功应用于电子、可见光和 X 射线领域。与其他相干衍射技术相比,层析成像技术的一个显著特点是它能通过重建算法处理部分空间和时间相干。在此,我们将重点放在时间上,并阐明影响层析成像算法能量分辨率限制的约束条件。在此基础上,我们设计并模拟了硬 X 射线条件下的宽带层析成像技术,它能使能量分辨率低至 1 eV。我们根据 NMC 电池阴极材料的实验层析成像数据对模拟进行了基准测试,达到了 5 eV 的能量分辨率。我们回顾了这些结果,讨论了其局限性,并为未来的宽带层析成像实验提供了指导,其在单次获取 X 射线吸收近边缘结构成像、磁分色成像方面的应用前景,以及对实现衍射有限分辨率的潜在影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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