{"title":"A highly accurate analytical method for determination of the vibrational frequency of N/MEMS with electrostatic and van der Waals interaction forces","authors":"Nguyen Nhu Hieu and Pham Ngoc Chung","doi":"10.1088/1361-6439/ad72ff","DOIUrl":null,"url":null,"abstract":"In this study, a novel approach based on the elliptic balance method (EBM) is proposed for the first time to find the approximate frequency of nano/micro-electromechanical systems modeled as Euler–Bernoulli beams under the effects of electrostatic and van der Waals interaction forces. Firstly, the governing equation of the beam is reduced to the single-mode vibration equation using the Galerkin method. A nonlinear differential equation for the time-dependent beam deflection is obtained. We present the approximate solution as an elliptic cosine function, which considers the free term contributing to the solution. This free term is relevant for vibrations with a non-zero mean in time, in which the beam is affected by a relatively large applied voltage. Via some manipulations, the obtained result is an algebraic equation with only one unknown in three unknowns: the free and vibration coefficient terms, and the modulus quantity of the elliptic cosine function. This nonlinear equation is solved using the Newton–Raphson method. The numerical results from the EBM show that the accuracy of the solution responses in time and approximate frequency is relatively accurate, almost coinciding with the results obtained from the numerical solution method using the Runge–Kutta algorithm. Our results also agree well with previously published experimental and simulation results. The results are meaningful when determining the frequency of the vibrating beam with high accuracy for micro/nano systems.","PeriodicalId":16346,"journal":{"name":"Journal of Micromechanics and Microengineering","volume":"8 1","pages":""},"PeriodicalIF":2.4000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Micromechanics and Microengineering","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1361-6439/ad72ff","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this study, a novel approach based on the elliptic balance method (EBM) is proposed for the first time to find the approximate frequency of nano/micro-electromechanical systems modeled as Euler–Bernoulli beams under the effects of electrostatic and van der Waals interaction forces. Firstly, the governing equation of the beam is reduced to the single-mode vibration equation using the Galerkin method. A nonlinear differential equation for the time-dependent beam deflection is obtained. We present the approximate solution as an elliptic cosine function, which considers the free term contributing to the solution. This free term is relevant for vibrations with a non-zero mean in time, in which the beam is affected by a relatively large applied voltage. Via some manipulations, the obtained result is an algebraic equation with only one unknown in three unknowns: the free and vibration coefficient terms, and the modulus quantity of the elliptic cosine function. This nonlinear equation is solved using the Newton–Raphson method. The numerical results from the EBM show that the accuracy of the solution responses in time and approximate frequency is relatively accurate, almost coinciding with the results obtained from the numerical solution method using the Runge–Kutta algorithm. Our results also agree well with previously published experimental and simulation results. The results are meaningful when determining the frequency of the vibrating beam with high accuracy for micro/nano systems.
期刊介绍:
Journal of Micromechanics and Microengineering (JMM) primarily covers experimental work, however relevant modelling papers are considered where supported by experimental data.
The journal is focussed on all aspects of:
-nano- and micro- mechanical systems
-nano- and micro- electomechanical systems
-nano- and micro- electrical and mechatronic systems
-nano- and micro- engineering
-nano- and micro- scale science
Please note that we do not publish materials papers with no obvious application or link to nano- or micro-engineering.
Below are some examples of the topics that are included within the scope of the journal:
-MEMS and NEMS:
Including sensors, optical MEMS/NEMS, RF MEMS/NEMS, etc.
-Fabrication techniques and manufacturing:
Including micromachining, etching, lithography, deposition, patterning, self-assembly, 3d printing, inkjet printing.
-Packaging and Integration technologies.
-Materials, testing, and reliability.
-Micro- and nano-fluidics:
Including optofluidics, acoustofluidics, droplets, microreactors, organ-on-a-chip.
-Lab-on-a-chip and micro- and nano-total analysis systems.
-Biomedical systems and devices:
Including bio MEMS, biosensors, assays, organ-on-a-chip, drug delivery, cells, biointerfaces.
-Energy and power:
Including power MEMS/NEMS, energy harvesters, actuators, microbatteries.
-Electronics:
Including flexible electronics, wearable electronics, interface electronics.
-Optical systems.
-Robotics.