Sub-nanometer-thick native sp2 carbon on oxidized diamond surfaces

Ricardo Vidrio, Cesar Saucedo, Vincenzo Lordi, Shimon Kolkowitz, Keith G. Ray, Robert J. Hamers, Jennifer T. Choy
{"title":"Sub-nanometer-thick native sp2 carbon on oxidized diamond surfaces","authors":"Ricardo Vidrio, Cesar Saucedo, Vincenzo Lordi, Shimon Kolkowitz, Keith G. Ray, Robert J. Hamers, Jennifer T. Choy","doi":"arxiv-2409.06934","DOIUrl":null,"url":null,"abstract":"Oxygen-terminated diamond has a wide breadth of applications, which include\nstabilizing near-surface color centers, semiconductor devices, and biological\nsensors. Despite the vast literature on characterizing functionalization groups\non diamond, the chemical composition on the shallowest portion of the surface\n(< 1 nm) is challenging to probe with conventional techniques like XPS and\nFTIR. In this work, we demonstrate the use of angle-resolved XPS to probe the\nfirst ten nanometers of (100) single-crystalline diamond, showing the changes\nof the oxygen functional groups and the allotropes of carbon with respect to\ndepth. With the use of consistent peak-fitting methods, the peak identities and\nrelative peak binding energies were identified for sp2 carbon, ether, hydroxyl,\ncarbonyl, and C-H groups. For the oxygen-terminated sample, we also quantified\nthe thickness of the sp2 carbon layer situated on top of the bulk sp3 diamond\nbonded carbon to be 0.4 $\\pm$ 0.1 nm, based on the analysis of the Auger\nelectron spectra and D-parameter calculations. These results indicate that the\nmajority of the oxygen is bonded to the sp2 carbon layer on the diamond, and\nnot directly on the sp3 diamond bonded carbon.","PeriodicalId":501234,"journal":{"name":"arXiv - PHYS - Materials Science","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Materials Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.06934","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Oxygen-terminated diamond has a wide breadth of applications, which include stabilizing near-surface color centers, semiconductor devices, and biological sensors. Despite the vast literature on characterizing functionalization groups on diamond, the chemical composition on the shallowest portion of the surface (< 1 nm) is challenging to probe with conventional techniques like XPS and FTIR. In this work, we demonstrate the use of angle-resolved XPS to probe the first ten nanometers of (100) single-crystalline diamond, showing the changes of the oxygen functional groups and the allotropes of carbon with respect to depth. With the use of consistent peak-fitting methods, the peak identities and relative peak binding energies were identified for sp2 carbon, ether, hydroxyl, carbonyl, and C-H groups. For the oxygen-terminated sample, we also quantified the thickness of the sp2 carbon layer situated on top of the bulk sp3 diamond bonded carbon to be 0.4 $\pm$ 0.1 nm, based on the analysis of the Auger electron spectra and D-parameter calculations. These results indicate that the majority of the oxygen is bonded to the sp2 carbon layer on the diamond, and not directly on the sp3 diamond bonded carbon.
氧化金刚石表面亚纳米厚的原生 Sp2 碳
氧端金刚石应用广泛,包括稳定近表面色彩中心、半导体器件和生物传感器。尽管有大量文献对金刚石的官能团进行了表征,但用 XPS 和FTIR 等传统技术探测表面最浅部分(< 1 nm)的化学成分仍具有挑战性。在这项工作中,我们展示了使用角度分辨 XPS 探测 (100) 单晶金刚石的前十个纳米,显示了氧官能团和碳的同素异形体随深度的变化。利用一致的峰拟合方法,确定了 sp2 碳、醚、羟基、羰基和 C-H 基团的峰特性和相关峰结合能。对于氧端样品,根据奥氏电子能谱分析和 D 参数计算,我们还确定了位于大块 sp3 金刚石键合碳顶部的 sp2 碳层厚度为 0.4 $\pm$ 0.1 nm。这些结果表明,大部分氧是键合在金刚石上的 sp2 碳层上,而不是直接键合在 sp3 金刚石键合碳上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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