{"title":"Harnessing neural networks for precise damage localization in photovoltaic solar via impedance-based structural health monitoring","authors":"Billel Sakhria, Brahim Hamaidi, Mahamed Djemana, Naamane Benhassine","doi":"10.1007/s00202-024-02700-5","DOIUrl":null,"url":null,"abstract":"<p>Accurate fault detection and monitoring are crucial for maintaining photovoltaic (PV) system performance. While previous studies mainly focused on PV system faults, they often lack a comprehensive approach to integrating advanced diagnostic techniques, leading to duplicated research efforts and insufficient exploration of novel methodologies. This paper investigates the use of the finite element method to simulate the electromechanical impedance technique for fault detection and classification in PV systems. A 3D finite element model of a photovoltaic panel was created using ANSYS software to understand the basics of this technique. Studies on different locations of structural cracks were conducted to assess their impact on PV system output. For model verification, various fault and normal state simulation datasets were collected, normalized using data from piezoelectric sensors, and preprocessed. These datasets were then fed into an extreme learning machine (ELM) algorithm designed to predict and classify damage locations. The results highlight the superior efficacy of the ELM algorithm in defect detection, boasting an impressive overall accuracy rate of 85%.</p>","PeriodicalId":50546,"journal":{"name":"Electrical Engineering","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2024-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Engineering","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1007/s00202-024-02700-5","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Accurate fault detection and monitoring are crucial for maintaining photovoltaic (PV) system performance. While previous studies mainly focused on PV system faults, they often lack a comprehensive approach to integrating advanced diagnostic techniques, leading to duplicated research efforts and insufficient exploration of novel methodologies. This paper investigates the use of the finite element method to simulate the electromechanical impedance technique for fault detection and classification in PV systems. A 3D finite element model of a photovoltaic panel was created using ANSYS software to understand the basics of this technique. Studies on different locations of structural cracks were conducted to assess their impact on PV system output. For model verification, various fault and normal state simulation datasets were collected, normalized using data from piezoelectric sensors, and preprocessed. These datasets were then fed into an extreme learning machine (ELM) algorithm designed to predict and classify damage locations. The results highlight the superior efficacy of the ELM algorithm in defect detection, boasting an impressive overall accuracy rate of 85%.
期刊介绍:
The journal “Electrical Engineering” following the long tradition of Archiv für Elektrotechnik publishes original papers of archival value in electrical engineering with a strong focus on electric power systems, smart grid approaches to power transmission and distribution, power system planning, operation and control, electricity markets, renewable power generation, microgrids, power electronics, electrical machines and drives, electric vehicles, railway electrification systems and electric transportation infrastructures, energy storage in electric power systems and vehicles, high voltage engineering, electromagnetic transients in power networks, lightning protection, electrical safety, electrical insulation systems, apparatus, devices, and components. Manuscripts describing theoretical, computer application and experimental research results are welcomed.
Electrical Engineering - Archiv für Elektrotechnik is published in agreement with Verband der Elektrotechnik Elektronik Informationstechnik eV (VDE).