Nanoporosity imaging by positronium lifetime tomography

arXiv - PHYS - Applied Physics Pub Date : 2024-09-12 DOI:arxiv-2409.07963

K. Dulski, E. Beyene, N. Chug, C. Curceanu, E. Czerwiński, M. Das, M. Gorgol, B. Jasińska, K. Kacprzak, Ł. Kapłon, G. Korcyl, T. Kozik, K. Kubat, D. Kumar, E. Lisowski, F. Lisowski, J. Mędrala-Sowa, S. Niedźwiecki, P. Pandey, S. Parzych, E. Perez del Rio, M. Rädler, S. Sharma, M. Skurzok, K. Tayefi, P. Tanty, E. Ł. Stępień, P. Moskal

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Abstract

Positron Annihilation Lifetime Spectroscopy (PALS) is a well-established non-destructive technique used for nanostructural characterization of porous materials. It is based on the annihilation of a positron and an electron. Mean positron lifetime in the material depends on the free voids size and molecular environment, allowing the study of porosity and structural transitions in the nanometer scale. We have developed a novel method enabling spatially resolved PALS, thus providing tomography of nanostructural characterization of an extended object. Correlating space (position) and structural (lifetime) information brings new insight in materials studies, especially in the characterization of the purity and pore distribution. For the first time, a porosity image using stationary positron sources for the simultaneous measurement of the porous polymers XAD4, silica aerogel powder IC3100, and polyvinyl toluene scintillator PVT by the J-PET tomograph is demonstrated

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利用正电子寿命层析成像技术进行纳米孔隙成像

正电子湮没寿命谱（PALS）是一种成熟的非破坏性技术，用于多孔材料的纳米结构表征。它基于正电子和电子的湮灭。正电子在材料中的平均寿命取决于自由空隙的大小和分子环境，因此可以研究纳米尺度的孔隙率和结构转变。我们开发了一种新方法，可以进行空间分辨正负电子激光扫描，从而对延伸物体的纳米结构特征进行层析成像。空间（位置）和结构（寿命）信息的关联为材料研究，尤其是纯度和孔隙分布的表征带来了新的视角。J-PET 层析成像仪首次利用固定正电子源同时测量了多孔聚合物 XAD4、二氧化硅气凝胶粉末 IC3100 和聚乙烯基甲苯闪烁体 PVT 的孔隙率图像。

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arXiv - PHYS - Applied Physics

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