Damien MichezLAPLACE-CS, Juliette LetellierNEEL - SC2G, Imane HammasNEEL - SC2G, Julien PernotNEEL - SC2G, Nicolas C. RougerLAPLACE-CS
{"title":"Over 50 mA current in interdigitated diamond field effect transistor","authors":"Damien MichezLAPLACE-CS, Juliette LetellierNEEL - SC2G, Imane HammasNEEL - SC2G, Julien PernotNEEL - SC2G, Nicolas C. RougerLAPLACE-CS","doi":"arxiv-2409.03293","DOIUrl":null,"url":null,"abstract":"This letter presents the bulk diamond field-effect transistor (FET) with the\nhighest current value reported at this moment. The goal was to drastically\nincrease the current of this type of device by increasing the total gate width\nthanks to an interdigitated architecture and homogeneous growth properties. We\nreport the results obtained by fabricating and characterizing an interdigitated\njunction FET (JFET). The device develops a total gate width of 14.7 mm, with 24\nparalleled fingers and a current higher than 50 mA at VDS = -15 V, VGS = 0 V,\nat 450 K and under illumination which is the highest value reported for a bulk\ndiamond FET. Its specific ON-resistance and threshold voltage are respectively\n608 m$\\Omega$.cm${}^2$, 50 V. From Transfer length method (TLM) measurements we\nextract a resistivity of 3.6 m$\\Omega$.cm for a heavily boron-doped\n(p++)-diamond layer and 1.52 $\\Omega$.cm for a 2.1017 cm-3 p-doped diamond\nlayer at 450 K. We measured the drain current versus gate voltage\ncharacteristics at high temperature showing that it is no longer the conduction\nchannel resistance but the device access resistance that is predominant. This\nstudy indicates that it is possible to drastically improve the ON-state of FETs\nby using an interdigitated architecture, while using homogeneous large size\ndiamond layers grown by CVD.","PeriodicalId":501083,"journal":{"name":"arXiv - PHYS - Applied Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.03293","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This letter presents the bulk diamond field-effect transistor (FET) with the
highest current value reported at this moment. The goal was to drastically
increase the current of this type of device by increasing the total gate width
thanks to an interdigitated architecture and homogeneous growth properties. We
report the results obtained by fabricating and characterizing an interdigitated
junction FET (JFET). The device develops a total gate width of 14.7 mm, with 24
paralleled fingers and a current higher than 50 mA at VDS = -15 V, VGS = 0 V,
at 450 K and under illumination which is the highest value reported for a bulk
diamond FET. Its specific ON-resistance and threshold voltage are respectively
608 m$\Omega$.cm${}^2$, 50 V. From Transfer length method (TLM) measurements we
extract a resistivity of 3.6 m$\Omega$.cm for a heavily boron-doped
(p++)-diamond layer and 1.52 $\Omega$.cm for a 2.1017 cm-3 p-doped diamond
layer at 450 K. We measured the drain current versus gate voltage
characteristics at high temperature showing that it is no longer the conduction
channel resistance but the device access resistance that is predominant. This
study indicates that it is possible to drastically improve the ON-state of FETs
by using an interdigitated architecture, while using homogeneous large size
diamond layers grown by CVD.