Electrical Impedance Tomography meets Reduced Order Modelling: a framework for faster and more reliable electrical conductivity estimations

Matthew R. Walker, Mariano Fernández-Corazza, Sergei Turovets, Leandro Beltrachini
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Abstract

Objective: Inclusion of individualised electrical conductivities of head tissues is crucial for the accuracy of electrical source imaging techniques based on electro/magnetoencephalography and the efficacy of transcranial electrical stimulation. Parametric electrical impedance tomography (pEIT) is a method to cheaply and non-invasively estimate them using electrode arrays on the scalp to apply currents and measure the resulting potential distribution. Conductivities are then estimated by iteratively fitting a forward model to the measurements, incurring a prohibitive computational cost that is generally lowered at the expense of accuracy. Reducing the computational cost associated with the forward solutions would improve the accessibility of this method and unlock new capabilities. Approach: We introduce reduced order modelling (ROM) to massively speed up the calculations of these solutions for arbitrary conductivity values. Main results: We demonstrate this new ROM-pEIT framework using a realistic head model with six tissue compartments, with minimal errors in both the approximated numerical solutions and conductivity estimations. We show that the computational complexity required to reach a multi-parameter estimation with a negligible relative error is reduced by more than an order of magnitude when using this framework. Furthermore, we illustrate the benefits of this new framework in a number of practical cases, including its application to real pEIT data from three subjects. Significance: Results suggest that this framework can transform the use of pEIT for seeking personalised head conductivities, making it a valuable tool for researchers and clinicians.
电阻抗断层扫描与降阶建模的结合:更快、更可靠的电导率估算框架
目的:纳入头部组织的个性化电导率对于基于脑电图/脑磁图的电源成像技术的准确性和经颅电刺激的有效性至关重要。参数电阻抗断层成像(pEIT)是一种利用头皮上的电极阵列施加电流并测量由此产生的电位分布,从而廉价、无创地估算电导率的方法。降低与正向求解相关的计算成本将提高这种方法的可用性,并锁定新的功能。方法:我们引入了降阶建模(ROM),以大幅加快这些任意电导率值求解的计算速度。主要成果:我们使用一个具有六个组织区划的现实头部模型演示了这一新的 ROM-pEIT 框架,近似数值解和电导率估算的误差都很小。结果表明,使用该框架后,达到可忽略相对误差的多参数估计所需的计算复杂度降低了一个数量级以上。此外,我们还在一些实际案例中说明了这一新框架的优势,包括将其应用于三个受试者的真实 pEIT 数据。意义重大:研究结果表明,该框架可以改变使用 pEIT 寻找个性化头部传导性的方法,使其成为研究人员和临床医生的宝贵工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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