Millimeter-Wave Integrated Silicon Devices: Active versus Passive -- The Eternal Struggle Between Good and Evil

Michele Spasaro, Domenico Zito
{"title":"Millimeter-Wave Integrated Silicon Devices: Active versus Passive -- The Eternal Struggle Between Good and Evil","authors":"Michele Spasaro, Domenico Zito","doi":"arxiv-2409.08176","DOIUrl":null,"url":null,"abstract":"With the extreme scaling, active devices in both CMOS and BiCMOS technologies\nhave reached outstanding ft/fmax, enabling an ever-increasing number of\nexisting and emerging applications in the microwave and millimeter wave\n(mm-wave) frequency range. The increase in transistors ft/fmax has been so much\nsignificant that the performance of microwave and mm-wave ICs are limited\nmainly by losses in passive devices. In this paper, we address a discussion on\nqualitative and quantitative aspects that may help to further unveil the impact\nof such losses on the overall circuit performance and stimulate the adoption of\neffective loss-aware design methodologies. As example, we report the results\nrelated to the design of low power mm-wave low noise amplifiers (LNAs). Our\nresults show how, in low power regime, the performances of mm-wave LNAs are\ndominated by losses in passive components. We also show how loss-aware design\nmethodologies can mitigate the performance degradation due to passives,\nresulting as an important tool to get the full potential out of the active\ndevices available today.","PeriodicalId":501034,"journal":{"name":"arXiv - EE - Signal Processing","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - EE - Signal Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.08176","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

With the extreme scaling, active devices in both CMOS and BiCMOS technologies have reached outstanding ft/fmax, enabling an ever-increasing number of existing and emerging applications in the microwave and millimeter wave (mm-wave) frequency range. The increase in transistors ft/fmax has been so much significant that the performance of microwave and mm-wave ICs are limited mainly by losses in passive devices. In this paper, we address a discussion on qualitative and quantitative aspects that may help to further unveil the impact of such losses on the overall circuit performance and stimulate the adoption of effective loss-aware design methodologies. As example, we report the results related to the design of low power mm-wave low noise amplifiers (LNAs). Our results show how, in low power regime, the performances of mm-wave LNAs are dominated by losses in passive components. We also show how loss-aware design methodologies can mitigate the performance degradation due to passives, resulting as an important tool to get the full potential out of the active devices available today.
毫米波集成硅器件:有源与无源 -- 善与恶的永恒斗争
随着规模的不断扩大,CMOS 和 BiCMOS 技术中的有源器件都达到了出色的 ft/fmax,使得微波和毫米波(mm-wave)频率范围内越来越多的现有和新兴应用成为可能。晶体管 ft/fmax 的提高如此显著,以至于微波和毫米波集成电路的性能主要受到无源器件损耗的限制。在本文中,我们将讨论定性和定量方面的问题,这可能有助于进一步揭示这些损耗对整体电路性能的影响,并促进采用有效的损耗感知设计方法。例如,我们报告了与低功率毫米波低噪声放大器(LNA)设计相关的结果。我们的研究结果表明,在低功耗条件下,毫米波低噪声放大器的性能主要取决于无源元件的损耗。我们还展示了损耗感知设计方法如何减轻无源元件造成的性能下降,从而成为充分发挥当今现有活动器件潜力的重要工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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