Maximizing the Synaptic Efficiency of Ferroelectric Tunnel Junction Devices Using a Switching Mechanism Hidden in an Identical Pulse Programming Learning Scheme

W. Kho, Hyun-Deog Hwang, Taewan Noh, Hoseong Kim, Ji Min Lee, Seung‐Eon Ahn
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Abstract

Memristors play a pivotal role in advanced computing, with memristor‐based crossbar arrays showing promise for various artificial neural networks. Among these, HfO2‐based ferroelectric tunnel junctions (FTJs) stand out as ideal synaptic devices for neuromorphic computing. Their compatibility with the complementary metal oxide semiconductor process and intrinsic energy efficiency make them particularly appealing. While an increasing number of studies adopt identical pulse programming (IPP) with short width to update the conductance of HfO2‐based FTJs synaptic devices, conventional ferroelectric switching models fall short in describing updates the conductance with the IPP scheme. Consequently, studies achieving conductance updates via IPP lack an underlying mechanism explanation, potentially limiting the application of HfO2‐based FTJs as synaptic devices. This study explores the potential of ferroelectric Zr‐doped HfO2 (HZO) FTJs to undergo learning through the IPP scheme. Synaptic characteristics, including the number of conductance states, symmetry, linearity, write energy, and latency by modulating IPP scheme conditions are optimized. Finally, the applicability of HZO FTJ as a synaptic device by assessing learning accuracy in pattern recognition through artificial neural network simulation based on the optimized synaptic characteristics is evaluated.
利用隐藏在相同脉冲编程学习方案中的开关机制最大化铁电隧道结器件的突触效率
忆阻器在先进计算中发挥着举足轻重的作用,基于忆阻器的交叉棒阵列在各种人工神经网络中大有可为。其中,基于二氧化铪的铁电隧道结(FTJ)是神经形态计算的理想突触器件。它们与互补金属氧化物半导体工艺的兼容性和内在能效使其特别具有吸引力。越来越多的研究采用短宽度相同脉冲编程(IPP)来更新基于 HfO2 的 FTJs 突触器件的电导,但传统的铁电开关模型无法描述 IPP 方案的电导更新。因此,通过IPP实现电导更新的研究缺乏内在机制的解释,可能会限制二氧化铪基 FTJs 作为突触器件的应用。本研究探讨了铁电掺杂Zr的HfO2(HZO)FTJ通过IPP方案进行学习的潜力。通过调节 IPP 方案的条件,优化了突触特性,包括电导状态的数量、对称性、线性度、写入能量和延迟。最后,根据优化后的突触特性,通过人工神经网络模拟评估模式识别中的学习准确性,从而评估 HZO FTJ 作为突触器件的适用性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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