Sebastian Hagemeier, Yijian Zou, T. Pahl, Felix Rosenthal, Peter Lehmann
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引用次数: 0
Abstract
Due to their contactless and fast measuring capabilities, laser interferometers represent an interesting alternative to tactile stylus instruments for surface profilometry. In addition to these outstanding attributes, acquisition costs play a major role in industry, limiting the frequent use of optical profilometers, which are significantly more expensive than tactile profilometers. We present a low-cost laser distance-measuring interferometer featuring axial repeatability below 1 nm at acquisition rates of 38,000 height values per second. The sensor’s performance is validated on several surface standards, achieving lateral scan velocities up to 160 mm/s. Further to high scan velocities, the high acquisition rate enables improved measurement accuracy by averaging measured height values. For example, the standard deviation of 625 pm for repeated measurements can be reduced to 265 pm at the expense of the data rate. However, the sensor concept provides the potential for further improvements in data rate and measurement repeatability.
期刊介绍:
Photonics (ISSN 2304-6732) aims at a fast turn around time for peer-reviewing manuscripts and producing accepted articles. The online-only and open access nature of the journal will allow for a speedy and wide circulation of your research as well as review articles. We aim at establishing Photonics as a leading venue for publishing high impact fundamental research but also applications of optics and photonics. The journal particularly welcomes both theoretical (simulation) and experimental research. Our aim is to encourage scientists to publish their experimental and theoretical results in as much detail as possible. There is no restriction on the length of the papers. The full experimental details must be provided so that the results can be reproduced. Electronic files and software regarding the full details of the calculation and experimental procedure, if unable to be published in a normal way, can be deposited as supplementary material.