Kang Du, Mingwei Xu, Yanling Xue, G. Du, B. Deng, Honglan Hong, Tiqiao Xiao
{"title":"Artefact correction of X-ray microtomography with deep-learning-generated flat fields","authors":"Kang Du, Mingwei Xu, Yanling Xue, G. Du, B. Deng, Honglan Hong, Tiqiao Xiao","doi":"10.1364/oe.529419","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":509080,"journal":{"name":"Optics Express","volume":"55 9","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oe.529419","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
