{"title":"Flexible Rogowski current probes in measurements of ultra-fast SiC MOSFET modules – limitations and challenges","authors":"Dawid Zięba","doi":"10.15199/48.2024.07.01","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":203126,"journal":{"name":"Przegląd Elektrotechniczny","volume":"48 23","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Przegląd Elektrotechniczny","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15199/48.2024.07.01","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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