A Deep Residual PLS for Data-Driven Quality Prediction Modeling in Industrial Process

IF 15.3 1区 计算机科学 Q1 AUTOMATION & CONTROL SYSTEMS
Xiaofeng Yuan;Weiwei Xu;Yalin Wang;Chunhua Yang;Weihua Gui
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引用次数: 0

Abstract

Partial least squares (PLS) model is the most typical data-driven method for quality-related industrial tasks like soft sensor. However, only linear relations are captured between the input and output data in the PLS. It is difficult to obtain the remaining nonlinear information in the residual subspaces, which may deteriorate the prediction performance in complex industrial processes. To fully utilize data information in PLS residual subspaces, a deep residual PLS (DRPLS) framework is proposed for quality prediction in this paper. Inspired by deep learning, DRPLS is designed by stacking a number of PLSs successively, in which the input residuals of the previous PLS are used as the layer connection. To enhance representation, nonlinear function is applied to the input residuals before using them for stacking highlevel PLS. For each PLS, the output parts are just the output residuals from its previous PLS. Finally, the output prediction is obtained by adding the results of each PLS. The effectiveness of the proposed DRPLS is validated on an industrial hydrocracking process.
用于工业流程数据驱动质量预测建模的深度残差 PLS
偏最小二乘法(PLS)模型是软传感器等质量相关工业任务中最典型的数据驱动方法。然而,在 PLS 模型中,输入和输出数据之间只有线性关系。在残差子空间中很难获取剩余的非线性信息,这可能会降低复杂工业过程中的预测性能。为了充分利用 PLS 残差子空间中的数据信息,本文提出了一种用于质量预测的深度残差 PLS(DRPLS)框架。受深度学习的启发,DRPLS 是通过连续堆叠多个 PLS 来设计的,其中前一个 PLS 的输入残差被用作层连接。为了增强代表性,在使用输入残差堆叠高层 PLS 之前,会对其应用非线性函数。对于每个 PLS,输出部分只是其上一个 PLS 的输出残差。最后,将每个 PLS 的结果相加即可得到输出预测结果。在工业加氢裂化过程中验证了所提出的 DRPLS 的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Ieee-Caa Journal of Automatica Sinica
Ieee-Caa Journal of Automatica Sinica Engineering-Control and Systems Engineering
CiteScore
23.50
自引率
11.00%
发文量
880
期刊介绍: The IEEE/CAA Journal of Automatica Sinica is a reputable journal that publishes high-quality papers in English on original theoretical/experimental research and development in the field of automation. The journal covers a wide range of topics including automatic control, artificial intelligence and intelligent control, systems theory and engineering, pattern recognition and intelligent systems, automation engineering and applications, information processing and information systems, network-based automation, robotics, sensing and measurement, and navigation, guidance, and control. Additionally, the journal is abstracted/indexed in several prominent databases including SCIE (Science Citation Index Expanded), EI (Engineering Index), Inspec, Scopus, SCImago, DBLP, CNKI (China National Knowledge Infrastructure), CSCD (Chinese Science Citation Database), and IEEE Xplore.
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