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Software defect prediction using global and local models

International Journal of System Assurance Engineering and Management Pub Date : 2024-07-02 DOI:10.1007/s13198-024-02407-7
Vikas Suhag, Sanjay Kumar Dubey, Bhupendra Kumar Sharma
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使用全局和局部模型预测软件缺陷
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International Journal of System Assurance Engineering and Management
International Journal of System Assurance Engineering and Management
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