Theory for electromigration at metal nanocontacts driven by kinetic energy transfer from “lucky electrons”

Yue Tian, Guangtai Lu, Shaoqing Du, K. Kuroyama, K. Hirakawa
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Abstract

We have developed a theory for electromigration at metal nanocontacts. In the proposed theory, a metal atom is removed by kinetic energy transfer from a “lucky electron” that ballistically traverses a metal nanocontact, when the applied voltage exceeds the surface self-diffusion potential of the metal. The histogram of the critical voltage, Vc, at which metal atoms are removed, depends on the temperature as well as the probability for an atom being removed by collision with a lucky electron. The histograms of Vc for Au, Ni, Pd are well explained by the present theory.
由 "幸运电子 "动能转移驱动的金属纳米接触点电迁移理论
我们提出了金属纳米触点电迁移理论。在提出的理论中,当施加的电压超过金属表面自扩散电位时,金属原子会通过动能转移从弹道穿越金属纳米接触的 "幸运电子 "上移除。金属原子被移除的临界电压 Vc 直方图取决于温度以及原子与幸运电子碰撞而被移除的概率。本理论可以很好地解释金、镍、钯的 Vc 直方图。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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