{"title":"GaAs Cone-Shell Quantum Dots in a Lateral Electric Field: Exciton Stark-Shift, Lifetime, and Fine-Structure Splitting","authors":"Ahmed Alshaikh, R. Blick, Christian Heyn","doi":"10.3390/nano14141174","DOIUrl":null,"url":null,"abstract":"Strain-free GaAs cone-shell quantum dots have a unique shape, which allows a wide tunability of the charge-carrier probability densities by external electric and magnetic fields. Here, the influence of a lateral electric field on the optical emission is studied experimentally using simulations. The simulations predict that the electron and hole form a lateral dipole when subjected to a lateral electric field. To evaluate this prediction experimentally, we integrate the dots in a lateral gate geometry and measure the Stark-shift of the exciton energy, the exciton intensity, the radiative lifetime, and the fine-structure splitting (FSS) using single-dot photoluminescence spectroscopy. The respective gate voltage dependencies show nontrivial trends with three pronounced regimes. We assume that the respective dominant processes are charge-carrier deformation at a low gate voltage U, a vertical charge-carrier shift at medium U, and a lateral charge-carrier polarization at high U. The lateral polarization forms a dipole, which can either enhance or compensate the intrinsic FSS induced by the QD shape anisotropy, dependent on the in-plane orientation of the electric field. Furthermore, the data show that the biexciton peak can be suppressed by a lateral gate voltage, and we assume the presence of an additional vertical electric field induced by surface charges.","PeriodicalId":508599,"journal":{"name":"Nanomaterials","volume":"21 5","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanomaterials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/nano14141174","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Strain-free GaAs cone-shell quantum dots have a unique shape, which allows a wide tunability of the charge-carrier probability densities by external electric and magnetic fields. Here, the influence of a lateral electric field on the optical emission is studied experimentally using simulations. The simulations predict that the electron and hole form a lateral dipole when subjected to a lateral electric field. To evaluate this prediction experimentally, we integrate the dots in a lateral gate geometry and measure the Stark-shift of the exciton energy, the exciton intensity, the radiative lifetime, and the fine-structure splitting (FSS) using single-dot photoluminescence spectroscopy. The respective gate voltage dependencies show nontrivial trends with three pronounced regimes. We assume that the respective dominant processes are charge-carrier deformation at a low gate voltage U, a vertical charge-carrier shift at medium U, and a lateral charge-carrier polarization at high U. The lateral polarization forms a dipole, which can either enhance or compensate the intrinsic FSS induced by the QD shape anisotropy, dependent on the in-plane orientation of the electric field. Furthermore, the data show that the biexciton peak can be suppressed by a lateral gate voltage, and we assume the presence of an additional vertical electric field induced by surface charges.
无应变砷化镓锥壳量子点具有独特的形状,可通过外部电场和磁场对电荷载流子概率密度进行广泛的调节。本文通过模拟实验研究了横向电场对光发射的影响。模拟预测电子和空穴在横向电场作用下会形成横向偶极子。为了在实验中评估这一预测,我们在横向栅极几何中整合了点,并使用单点光致发光光谱法测量了激子能量的星移、激子强度、辐射寿命和精细结构分裂(FSS)。各自的栅极电压依赖性呈现出非对称的趋势,有三种明显的状态。我们假设各自的主导过程分别是低栅极电压 U 下的电荷载流子变形、中等 U 下的垂直电荷载流子偏移和高 U 下的横向电荷载流子极化。横向极化形成一个偶极子,它可以增强或补偿由 QD 形状各向异性诱导的固有 FSS,这取决于电场的面内取向。此外,数据还显示,双激子峰值可被横向栅极电压抑制,我们假设存在由表面电荷诱导的额外垂直电场。