Dispersion frequency technique to explain the charge transfer process involved in cadmium detection using aniline, N-phenylglycine and graphene oxide based electrochemical sensor
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引用次数: 0
Abstract
A new technique, termed as dispersion frequency (DF) technique, based on Maxwell Wagner dispersion frequency, was proposed for the first time in an electrochemical sensor to explain the charge transfer mechanism involved, behind the sensing process. Dispersion frequency can be characterized by the maximum dispersion in capacitance, which is an interfacial relaxation effect, and occurs in systems where electric current passes through the electrode electrolyte interface across the double layer. In this work, this technique was used to explain the reason behind the improvement in the selectivity by varying the film thickness and amount of graphene oxide (GO), in composite (from aniline, N-phenylglycine and GO) films. For that purpose, electrochemical impedance spectroscopy (EIS) experiments were conducted, and the DF values were evaluated. It was found that the DF values decrease with film thickness and increase with the GO content when detecting Cd2+ in buffer. Also, the DF value changed (decreased) in presence of interfering species. Thus, it was demonstrated that the DF values could be used to predict and explain the interference effect. The behavior of the DF values was opposite to that of the barrier width (BW) values as studied in a previous work which too were a function of the film thickness and the GO content. Both explain independent physical phenomena which are related to the same charge transfer process. In this work, a correlation coefficient relating the barrier width and dispersion frequency values with respect to film thicknesses at any specific amount of GO content was evaluated. This correlation coefficient can be used to evaluate one parameter if the other is known for a series of film thicknesses by doing lesser number of EIS experiments.
在电化学传感器中首次提出了一种基于麦克斯韦-瓦格纳色散频率的新技术,即色散频率(DF)技术,用以解释传感过程背后所涉及的电荷转移机制。色散频率可以用电容的最大色散来表征,它是一种界面弛豫效应,发生在电流穿过双层电极电解质界面的系统中。在这项研究中,我们使用这种技术来解释通过改变薄膜厚度和氧化石墨烯(GO)的用量来提高复合薄膜(由苯胺、N-苯基甘氨酸和 GO 制成)选择性的原因。为此,我们进行了电化学阻抗光谱(EIS)实验,并评估了 DF 值。实验发现,在检测缓冲液中的 Cd2+ 时,DF 值随薄膜厚度的增加而减小,随 GO 含量的增加而增大。此外,在存在干扰物的情况下,DF 值也会发生变化(降低)。由此证明,DF 值可以用来预测和解释干扰效应。DF 值的行为与之前研究的阻挡宽度 (BW) 值相反,后者也是薄膜厚度和 GO 含量的函数。两者都解释了与相同电荷转移过程相关的独立物理现象。在这项工作中,我们评估了在任何特定数量的 GO 含量下,阻挡宽度和色散频率值与薄膜厚度之间的相关系数。如果已知一系列薄膜厚度的另一个参数,则可以通过较少数量的 EIS 实验来评估该相关系数。