Finite difference delay modelling for analysis of shielding effectiveness of perforated conductive enclosure

IF 1.4 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Ali Kalantarnia, Siavash Rajabi, Abdollah Mirzabeigi
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引用次数: 0

Abstract

This paper introduces finite difference delay modelling (FDDM) for computing the shielding effectiveness (SE) of a conductive enclosure with an aperture against electromagnetic pulses. FDDM offers optimal accuracy and stability for analysing complex structures. The time domain electric field integral equation (TD-EFIE) for the conductive enclosure is derived by imposing boundary conditions on the perfect electrical conductor (PEC) surface in the Laplace domain. Time discretization is based on finite differences, and the Laplace-to-Z transform mapping is utilized. Fast Fourier Transform (FFT) is employed to expedite the FDDM solution process. Both frequency domain shielding effectiveness (FD-SE) and time domain shielding effectiveness (TD-SE) are evaluated using this approach. Finally, to validate the accuracy of the proposed method, results are compared with simulations using CST-MWS software and the frequency domain moment method.

Abstract Image

用于分析穿孔导电外壳屏蔽效果的有限差分延迟模型
本文介绍了有限差分延迟建模(FDDM),用于计算带有孔径的导电外壳对电磁脉冲的屏蔽效能(SE)。FDDM 可为复杂结构的分析提供最佳精度和稳定性。导电外壳的时域电场积分方程(TD-EFIE)是通过在拉普拉斯域中的完美电导体(PEC)表面施加边界条件推导出来的。时间离散基于有限差分,并利用拉普拉斯-Z 变换映射。采用快速傅立叶变换 (FFT) 加快 FDDM 的求解过程。频域屏蔽效果(FD-SE)和时域屏蔽效果(TD-SE)均采用这种方法进行评估。最后,为了验证所提方法的准确性,将结果与使用 CST-MWS 软件和频域矩法进行的模拟进行了比较。
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来源期刊
Iet Science Measurement & Technology
Iet Science Measurement & Technology 工程技术-工程:电子与电气
CiteScore
4.30
自引率
7.10%
发文量
41
审稿时长
7.5 months
期刊介绍: IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.
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