Measurements of atomic hydrogen recombination coefficients and the reduction of Al2O3 using a heat flux sensor

Aneta S. Stodolna, Shyama Ramankutty, Michiel Blauw, Tommy de Jonge, Arnold J. Storm, J. F. M. Velthuis
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Abstract

The knowledge of atomic hydrogen recombination coefficient (γ) is essential for plasma simulations to calculate accurate atomic hydrogen fluxes. However, γ is a complex material property, and it is affected by the experimental conditions under which it is measured. Therefore, values of γ can differ even by a few orders of magnitude for the same material. In this paper, we demonstrate measurements of hydrogen recombination coefficients at room temperature using an in-house-built catalytic sensor for two selected materials: aluminum Al-5083 (alimex) and stainless steel 316 l, under the load of low-temperature H2 plasma with an admixture of H2O or N2 gases. The plasma settings were carefully chosen to mimic properties of the so-called extreme ultraviolet-generated plasma.1 The measured γ values agree well with literature data obtained for similar plasma conditions and show a correlation with ion energy. Additionally, we show a novel application of the sensor for indirect measurements of the reduction of oxidized surfaces as a function of ion dose. In these experiments, a correlation between reduction time and background water pressure is observed.
使用热通量传感器测量原子氢重组系数和 Al2O3 的还原性
了解原子氢重组系数(γ)对于等离子体模拟计算精确的原子氢通量至关重要。然而,γ 是一种复杂的材料属性,它受到测量实验条件的影响。因此,对于同一种材料,γ 值甚至可能相差几个数量级。在本文中,我们展示了使用内部自制的催化传感器对两种选定材料(铝 Al-5083 (alimex)和不锈钢 316 l)在室温下氢重组系数的测量结果,这两种材料在低温 H2 等离子体的负载下混合了 H2O 或 N2 气体。我们精心选择了等离子体设置,以模拟所谓的极端紫外线产生的等离子体的特性1。测得的γ 值与类似等离子体条件下获得的文献数据非常吻合,并显示出与离子能量的相关性。此外,我们还展示了传感器在间接测量氧化表面的还原度与离子剂量函数关系方面的新应用。在这些实验中,我们观察到了还原时间与背景水压之间的相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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