{"title":"Enhancing the effectiveness of output projection in wafer fabrication using an Industry 4.0 and XAI approach","authors":"Tin-Chih Toly Chen, Yu-Cheng Wang, Chi-Wei Lin","doi":"10.1007/s00170-024-14105-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":519043,"journal":{"name":"The International Journal of Advanced Manufacturing Technology","volume":"1 9","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The International Journal of Advanced Manufacturing Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s00170-024-14105-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}